Granted Patent
Utility
US 6,783,274 · App. 10/391,592
Device for measuring temperature of semiconductor integrated circuit
Inventors:
Takehiko Umeyama, Kazuyuki Ohmi
Patented Case
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Granted: Aug 31, 2004
Filed: Mar 20, 2003
Inventors
Takehiko Umeyama
Kazuyuki Ohmi
Assignee (at issue)
Renesas Technology Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.