IP Library Granted Patent US 6,784,445
Granted Patent Utility
US 6,784,445 · App. 10/033,950

Apparatus for monitoring intentional or unavoidable layer depositions and method

Inventors: Jürgen Ziegler, Reinhold Waller, Lothar Pfitzner, Claus Schneider, Heiner Ryssel, Volker Tegeder
Patented Case View Patent ↗
Granted: Aug 31, 2004 Filed: Dec 28, 2001
Inventors
Jürgen Ziegler
Reinhold Waller
Lothar Pfitzner
Claus Schneider
Heiner Ryssel
Volker Tegeder
Assignees (at issue)
raunhofer-Gesellschaft zur Foederung der Angewandten Forschung E.V.
Infineon Technologies AG

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Quick Facts
Patent No.
US 6,784,445
App. No.
10/033,950
Filed
2001-12-28
Granted
2004-08-31
Kind
B2