Granted Patent
Utility
US 6,784,686 · App. 10/430,271
Semiconductor testing device
Inventors:
Hiroki Nishida, Yoshihiro Nagura
Patented Case
View Patent ↗
Granted: Aug 31, 2004
Filed: May 7, 2003
Inventors
Hiroki Nishida
Yoshihiro Nagura
Assignee (at issue)
Renesas Technology Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.