Granted Patent
Utility
US 6,787,364 · App. 09/847,548
Sample chip analyzing device and method for analyzing the same
Inventors:
Haruo Tajima, Hidekatsu Yoneda
Patented Case
View Patent ↗
Granted: Sep 7, 2004
Filed: May 2, 2001
Inventors
Haruo Tajima
Hidekatsu Yoneda
Assignee (at issue)
Nippon Laser & Electronics Lab.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.