Granted Patent
Utility
US 6,789,224 · App. 09/761,199
Method and apparatus for testing semiconductor devices
Inventor:
Takeo Miura
Patented Case
View Patent ↗
Granted: Sep 7, 2004
Filed: Jan 16, 2001
Inventor
Takeo Miura
Assignee (at issue)
Advantest Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.