Granted Patent
Utility
US 6,791,345 · App. 10/059,114
Contactor for testing semiconductor device and manufacturing method thereof
Inventors:
Shigeyuki Maruyama, Kazuhiro Tashiro, Naoyuki Watanabe, Daisuke Koizumi, Takafumi Hashitani, Ei Yano
Patented Case
View Patent ↗
Granted: Sep 14, 2004
Filed: Jan 31, 2002
Inventors
Shigeyuki Maruyama
Kazuhiro Tashiro
Naoyuki Watanabe
Daisuke Koizumi
Takafumi Hashitani
Ei Yano
Assignee (at issue)
Fujitsu Limited
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.