Granted Patent
Utility
US 6,791,350 · App. 09/917,959
Inspection method for array substrate and inspection device for the same
Inventor:
Tomoyuki Taguchi
Patented Case
View Patent ↗
Granted: Sep 14, 2004
Filed: Jul 30, 2001
Inventor
Tomoyuki Taguchi
Assignee (at issue)
International Business Machines Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.