IP Library Granted Patent US 6,795,953
Granted Patent Utility
US 6,795,953 · App. 10/167,039

Method for avoiding false failures attributable to dummy interconnects during defect analysis of an integrated circuit design

Inventors: Sergei G. Bakarian, Julie Segal
Patented Case View Patent ↗
Granted: Sep 21, 2004 Filed: Jun 11, 2002
Inventors
Sergei G. Bakarian
Julie Segal
Assignee (at issue)
HPL TECHNOLOGIES GMBH

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Quick Facts
Patent No.
US 6,795,953
App. No.
10/167,039
Filed
2002-06-11
Granted
2004-09-21
Kind
B2