Granted Patent
Utility
US 6,798,863 · App. 10/147,421
Combined x-ray analysis apparatus
Inventor:
Masao Sato
Patented Case
View Patent ↗
Granted: Sep 28, 2004
Filed: May 16, 2002
Inventor
Masao Sato
Assignee (at issue)
SII NanoTechnology Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.