Granted Patent
Utility
US 6,799,290 · App. 09/512,756
Data path calibration and testing mode using a data bus for semiconductor memories
Inventors:
Toshiaki Kirihata, Gerhard Mueller, David R. Hanson
Patented Case
View Patent ↗
Granted: Sep 28, 2004
Filed: Feb 25, 2000
Inventors
Toshiaki Kirihata
Gerhard Mueller
David R. Hanson
Assignee (at issue)
Infineon Technologies North America Corp.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.