IP Library Granted Patent US 6,800,407
Granted Patent Utility
US 6,800,407 · App. 10/135,684

Method for experimentally verifying imaging errors in photomasks

Inventors: Gunther Czech, Ernst-Christian Richter, Ulrich Scheler, Michael Sebald
Patented Case View Patent ↗
Granted: Oct 5, 2004 Filed: Apr 30, 2002
Inventors
Gunther Czech
Ernst-Christian Richter
Ulrich Scheler
Michael Sebald
Assignee (at issue)
Infineon Technologies AG

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Quick Facts
Patent No.
US 6,800,407
App. No.
10/135,684
Filed
2002-04-30
Granted
2004-10-05
Kind
B2