Granted Patent
Utility
US 6,808,945 · App. 10/339,536
Method and system for testing tunnel oxide on a memory-related structure
Inventors:
Zhigang Wang, Hsiao-Han Thio, Nian Yang
Patented Case
View Patent ↗
Granted: Oct 26, 2004
Filed: Jan 8, 2003
Inventors
Zhigang Wang
Hsiao-Han Thio
Nian Yang
Assignee (at issue)
Advanced Micro Devices, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.