IP Library › Granted Patent US 6,809,540
Granted Patent Utility
US 6,809,540 · App. 10/013,880

Integrated circuit test structure

Inventor: Clive David Beech
Patented Case View Patent ↗
Granted: Oct 26, 2004 Filed: Dec 11, 2001
Inventor
Clive David Beech
Assignee (at issue)
Zarlink Semiconductor (US) Inc.

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Quick Facts
Patent No.
US 6,809,540
App. No.
10/013,880
Filed
2001-12-11
Granted
2004-10-26
Kind
B2