Granted Patent
Utility
US 6,813,739 · App. 09/543,023
Scan interface chip (SIC) system and method for scan testing electronic systems
Inventor:
Louis C. Grannis, III
Patented Case
View Patent ↗
Granted: Nov 2, 2004
Filed: Apr 4, 2000
Inventor
Louis C. Grannis, III
Assignee (at issue)
Silicon Graphics, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.