Granted Patent
Utility
US 6,815,325 · App. 10/660,753
Semiconductor device and test method for manufacturing same
Inventor:
Junya Ishii
Patented Case
View Patent ↗
Granted: Nov 9, 2004
Filed: Sep 12, 2003
Inventor
Junya Ishii
Assignee (at issue)
NEC Electronics Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.