Granted Patent
Utility
US 6,815,964 · App. 10/033,364
Test board de-embedding method to improve RF measurements accuracy on an automatic testing equipment for IC wafers
Inventors:
Giuseppe Di Gregorio, Maria Luisa Gambina, Biagio Russo
Patented Case
View Patent ↗
Granted: Nov 9, 2004
Filed: Dec 26, 2001
Inventors
Giuseppe Di Gregorio
Maria Luisa Gambina
Biagio Russo
Assignee (at issue)
STMICROELECTRONICS S.r.l.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.