Granted Patent
Utility
US 6,823,713 · App. 10/411,728
Scanning tip orientation adjustment method for atomic force microscopy
Inventor:
David James Shuman
Patented Case
View Patent ↗
Granted: Nov 30, 2004
Filed: Apr 11, 2003
Inventor
David James Shuman
Assignee (at issue)
Infineon Technologies AG
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.