Granted Patent
Utility
US 6,825,682 · App. 09/826,594
Test configuration for the functional testing of a semiconductor chip
Inventors:
Dieter Kantz, Jochen Müller
Patented Case
View Patent ↗
Granted: Nov 30, 2004
Filed: Apr 5, 2001
Inventors
Dieter Kantz
Jochen Müller
Assignee (at issue)
Infineon Technologies AG
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.