Granted Patent
Utility
US 6,831,476 · App. 10/747,952
On-chip ADC test for image sensors
Inventor:
Kwang-Bo Cho
Patented Case
View Patent ↗
Granted: Dec 14, 2004
Filed: Dec 31, 2003
Inventor
Kwang-Bo Cho
Assignee (at issue)
Micron Technology, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.