Granted Patent
Utility
US 6,832,508 · App. 10/613,451
Atomic force microscopy measurements of contact resistance and current-dependent stiction
Inventor:
Shiva Prakash
Patented Case
View Patent ↗
Granted: Dec 21, 2004
Filed: Jul 3, 2003
Inventor
Shiva Prakash
Assignee (at issue)
Fidelica Microsystems
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.