Granted Patent
Utility
US 6,836,014 · App. 10/264,716
Optical testing of integrated circuits with temperature control
Inventors:
Dean Hunt, Don Haga
Patented Case
View Patent ↗
Granted: Dec 28, 2004
Filed: Oct 3, 2002
Inventors
Dean Hunt
Don Haga
Assignee (at issue)
Credence Systems Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.