Granted Patent
Utility
US 6,836,210 · App. 10/292,175
Adverse condition detector having modulated test signal
Inventor:
William P. Tanguay
Patented Case
View Patent ↗
Granted: Dec 28, 2004
Filed: Nov 12, 2002
Inventor
William P. Tanguay
Assignee (at issue)
Maple Chase Company
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.