Granted Patent
Utility
US 6,836,863 · App. 09/925,138
Semiconductor memory testing method and apparatus
Inventors:
Makoto Tabata, Noboru Okino
Patented Case
View Patent ↗
Granted: Dec 28, 2004
Filed: Aug 8, 2001
Inventors
Makoto Tabata
Noboru Okino
Assignee (at issue)
Advantest Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.