IP Library Granted Patent US 6,878,607
Granted Patent B2
US 6,878,607 · App. 10/260,791 · Granted Apr 12, 2005

Thin film device transfer method, thin film device, thin film integrated circuit device, active matrix board, liquid crystal display, and electronic apparatus

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Quick Facts
Patent No.
US 6,878,607
App. No.
10/260,791
Granted
Apr 12, 2005
Kind
B2
Abstract

A thin film device fabrication method in which a thin film device formed on a substrate are transferred to a primary destination-of-transfer part and then the thin film device is transferred to a secondary destination-of-transfer part. A first separation layer ( 120 ) made of such a material as amorphous silicon is provided on a substrate ( 100 ) which allows passage of laser. A thin film device ( 140 ) such as TFTs are formed on the substrate ( 100 ). Further, a second separation layer ( 160 ) such as a hot-melt adhesive layer is formed on the thin film devices ( 140 ), and a primary destination-of-transfer part ( 180 ) is mounted thereon. The bonding strength of the first separation layer is weakened by irradiation with light, and the substrate ( 100 ) is removed. Thus, the thin film device ( 140 ) is transferred to the primary destination-of-transfer part. Then, a secondary destination-of-transfer part ( 200 ) is attached onto the bottom of an exposed part of the thin film device ( 140 ) via an adhesive layer ( 190 ). Thereafter, the bonding strength of the second separation layer is weakened by such means as thermal fusion, and the primary destination-of-transfer part is removed. In this manner, the thin film device ( 140 ) can be transferred to the secondary destination-of-transfer part ( 200 ) while maintaining layering relationship with respect to the substrate ( 100 ).

Claims (56)

1. A method for making a circuit, comprising:

a first step of forming a first separation layer on a substrate;

a second step of forming an object-of-transfer layer including a device on said first separation layer;

a third step of forming a second separation layer on said object-of-transfer layer;

a fourth step of attaching a primary destination-of-transfer part to said second separation layer;

a fifth step of causing exfoliation in an inner-layer and/or interface of said first separation layer, and then removing said substrate from said object-of-transfer layer while retaining at least part of said first separation layer on said object-of-transfer layer using said first separation layer as a boundary;

a sixth step of removing said first separation layer from said object-of-transfer layer;

a seventh step of attaching a secondary destination-of-transfer part to the bottom of said object-of-transfer layer; and

an eighth step of removing said primary destination-of-transfer part and said second separation layer from said object-of-transfer layer,

wherein said circuit includes said object-of-transfer layer including the device transferred to said secondary destination-of-transfer part.

2. The method as defined in claim 1 , wherein:

said second separation layer is made of an adhesive material; and

said eighth step includes a step of melting said adhesive material.

3. The method as defined in claim 1 , wherein said second step includes a step of forming an electrode for conduction of said device after formation of said device.

4. The method as defined in claim 1 , wherein said secondary destination-of-transfer part is made of a material having a glass transition temperature (Tg) of softening point which is lower than or equal to a maximum temperature T max used in formation of said object-of-transfer layer.

5. The method as defined in claim 1 , wherein said secondary destination-of-transfer part has a glass transition temperature (Tg) or softening point which is lower than or equal to a maximum temperature used in formation of said device.

6. The method as defined in claim 1 , wherein said secondary destination-of-transfer part is made of a synthetic resin or glass material.

7. The method as defined in claim 1 , wherein said substrate is made of a material having a distortion point which is higher than or equal to a maximum temperature T max used in formation of said object-of-transfer layer.

8. The method as defined in claim 1 , wherein said device includes a thin film transistor (TFT).

9. A method for making a circuit, comprising:

a first step of forming a first separation layer on a substrate;

a second step of forming an object-of-transfer layer including a device on said first separation layer;

a third step of forming a second separation layer on said object-of-transfer layer;

a fourth step of attaching a primary destination-of-transfer part to said second separation layer;

a fifth step of causing exfoliation in an inner-layer and/or interface of said first separation layer, and then removing said substrate from said object-of-transfer layer while retaining at least part of said first separation layer on said object-of-transfer layer;

a sixth step of removing said first separation layer from said object-of-transfer layer;

a seventh step of attaching a secondary destination-of-transfer part which is larger than said substrate to the bottom of said object-of-transfer layer; and

an eighth step of removing said primary destination-of-transfer part and said second separation layer from said object-of-transfer layer,

wherein a plurality of said object-of-transfer layers are transferred to said secondary destination-of-transfer part by repeating said first to eighth steps a plural number of times, and

wherein said circuit includes said plurality of object-of-transfer layers each including the device.

10. The method for making a circuit as defined in claim 1 , wherein in the fifth step, the exfoliation is induced by light irradiation.

11. An electronic apparatus comprising the circuit manufactured by using the method as defined in claim 1 .

12. An electronic apparatus comprising a circuit manufactured by using the method as defined in claim 9 .

13. A method for making an active matrix substrate, comprising:

a first step of forming a first separation layer on a substrate;

a second step of forming an object-of-transfer layer including a device above a substrate on said first separation layer;

a third step of forming a second separation layer on said object-of-transfer layer;

a fourth step of attaching a primary destination-of-transfer part to said separation layer;

a fifth step of causing exfoliation in an inner-layer and/or interface of said first separation layer, and then removing said substrate from said object-of-transfer layer while retaining at least a part of said first separation layer on said object-of-transfer layer;

a sixth step of removing said first separation layer from said object-of-transfer layer;

a seventh step of attaching a secondary destination-of-transfer part to the bottom of said object-of-transfer layer; and

an eighth step of removing said primary destination-of-transfer part and said second separation layer from said object-of-transfer layer,

wherein said active matrix substrate includes said object-of-transfer layer including the device transferred to said secondary destination-of-transfer part.

14. A liquid crystal device comprising the active matrix substrate manufactured by using the method as defined in claim 13 .

15. A method for making an active matrix substrate, comprising:

a first step of forming a first separation layer on a substrate;

a second step of forming an object-of-transfer layer including a device above a substrate on said first separation layer;

a third step of forming a second separation layer on said object-of-transfer layer;

a fourth step of attaching a primary destination-of-transfer part to said separation layer;

a fifth step of causing exfoliation in an inner-layer and/or interface of said first separation layer, and then removing said substrate from said object-of-transfer layer while retaining at least a part of said first separation layer on said object-of-transfer layer;

a sixth step of removing said first separation layer from said object-of-transfer layer;

a seventh step of attaching a secondary destination-of-transfer part to the bottom of said object-of-transfer layer; and

an eighth step of removing said primary destination-of-transfer part and said second separation layer from said object-of-transfer layer,

wherein a plurality of said object-of-transfer layers are transferred to said secondary destination-of-transfer part by repeating said first to eighth steps a plural number of times, and

wherein said active matrix substrate includes said plurality of object-of-transfer layers each including the device.

16. A liquid crystal device comprising the active matrix substrate manufactured by using the method as defined in claim 15 .

Assignments (2)
MERGER Recorded Aug 7, 2012
From: SAMSUNG LED CO., LTD.
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 028744/0272 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 12, 2012
From: SEIKO EPSON CORPORATION
To: SAMSUNG LED CO., LTD.
Reel/Frame 027524/0837 →