Capacitor calibration in SAR converter
Capacitor calibration in SAR converter. A method for calibrating a switched capacitor array in a SAR data converter is disclosed, which array includes a plurality of primary capacitors having a common node plate interfaced to a common node and a switched plate interfaced to a switch that is operable to be switched between first and second reference voltages. A comparator having an input connected to the common node and a reference input connected to a comparator reference node receives a comparator reference voltage. In a first calibration step for calibrating one of the primary capacitors, a reference capacitor is provided and then, the switched plate of the select primary capacitor is connected to the first reference voltage, the switched plate of the other capacitors and the reference capacitor are connected to the second reference voltage, and the common node and the comparator reference node are driven with a driver to dispose a first voltage thereon. In a second calibration step, the common node is allowed to float, the switched plate of the select primary capacitor is connected to the second reference voltage, the switched plate of the reference capacitor is connected to the first reference voltage, and the voltage on the common node is compared to the first voltage on the comparator reference node. A determination is then made as to whether the voltage on the common node is greater than the first voltage. A plurality of trim capacitors are provided and, if in the second calibration step, the voltage on the common node was determined to be greater than the first voltage, then one of the trim capacitors is disposed in parallel with the select one of the primary capacitors and then the first and second calibrating steps are repeated.
1. A method for calibrating a switched capacitor array in a SAR data converter, which capacitor array includes a plurality of primary capacitors each having a common node plate interfaced to a common node and a switched plate interfaced to a switch that is operable to be switched between first and second reference voltages, comprising the steps of:
providing a comparator having an input connected to the common node and a reference input connected to a comparator reference node for receiving a comparator reference voltage;
in a first calibration step for calibrating a select one of the primary capacitors:
providing a reference capacitor with a common plate connected to the common node and a switched plate interfaced to a switch that is operable to be switched between the first and second reference voltages,
connecting the switched plate of the select primary capacitor to the first reference voltage,
connecting the switched plate of the other capacitors and the reference capacitor to the second reference voltage, and
driving voltage to the common node and the comparator reference node to dispose a first voltage thereon;
in a second calibration step:
allowing the common node to float,
connecting the switched plate of the select primary capacitor to the second reference voltage,
connecting the switched plate of the reference capacitor to the first reference voltage, and
comparing the voltage on the common node to the first voltage on the comparator reference node with the comparator to determine if the voltage on the common node is greater than the first voltage;
providing a plurality of trim capacitors; and
if, in the second calibration step, it was determined that the voltage on the common node was greater than the first voltage, then disposing one of the trim capacitors in parallel with the select one of the primary capacitors and then repeating the first and second calibrating steps.
2. The method of claim 1 , wherein the second voltage is ground.
3. The method of claim 1 , wherein the capacitor array is binary weighted capacitor array, wherein the capacitors range from a normalized first capacitor value C to a next value of 2C and so on.
4. The method of claim 3 , wherein the reference capacitor is comprised of the combination of the lower valued capacitors in the capacitor array and a dummy capacitor of a value C with a common plate connected to the common node and a switched plate interfaced to a switch that is operable to be switched between first and second reference voltages wherein, in the second calibration step, the switched plate of all of the lower valued capacitors and the dummy capacitors connected to the first reference voltage.
5. The method of claim 4 , wherein the trim capacitors comprise an array of trim capacitors, each having a common plate connected to the common node and a switched plate interfaced to a trim capacitor switch that is operable to be switched between the first and second reference voltages.
6. The method of claim 5 , wherein the trim capacitors are binary weighted.
7. The method of claim 6 , wherein the operation of repeating the first and second calibration steps utilizes a successive approximation algorithm.
8. The method of claim 4 , wherein a plurality of the primary capacitors are calibrated, each having an array of trim capacitors associated therewith which are selectable in the first and second calibration steps.
9. The method of claim 8 , wherein the final configuration of all of the trim capacitors is stored in a non volatile memory.
10. The method of claim 9 , wherein the SAR data converter upon power up has the configuration information downloaded from the non volatile memory to configure the trim capacitors.
11. A calibrated switched capacitor array in a SAR data converter, which capacitor array includes a plurality of primary capacitors each having a common node plate interfaced to a common node and a switched plate interfaced to a primary capacitor switch that is operable to be switched between first and second reference voltages, comprising:
a comparator having a signal input connected to the common node and a reference input connected to a comparator reference node for receiving a comparator reference voltage;
a reference capacitor with a common plate connected to the common node and a switched plate interfaced to a reference capacitor switch that is operable to be switched between the first and second reference voltages;
a common node switch for allowing the common node to either float or be connected to the signal input of said comparator;
a voltage driver for driving the common node and the comparator reference node to dispose a first voltage thereon;
a plurality of trim capacitors disposable in parallel with select ones of the primary capacitors;
a calibration engine operable in a first calibration phase to:
close the common node switch such that the common node is connected to the signal input,
connect the switched plate of the select primary capacitor to the first reference voltage, and
connect the switched plate of the other of the primary capacitors and the reference capacitor to the second reference voltage; and
said calibration engine operable in a second calibration phase to:
open the common node switch such that the common node is allowed to float,
connect the switched plate of the select primary capacitor to the second reference voltage,
connect the switched plate of the reference capacitor to the first reference voltage,
said comparator comparing the voltage on the common node to the first voltage on said comparator reference node to determine if the voltage on the common node is greater than the first voltage, and
if, in the second calibration phase, it was determined that the voltage on the common node was greater than the first voltage, then said calibration engine disposing one of said trim capacitors in parallel with the select one of the primary capacitors and then repeating the first and second calibrating phases.
12. The capacitor array of claim 11 , wherein the second voltage is ground.
13. The capacitor array of claim 11 , wherein the capacitor array is binary weighted capacitor array, wherein the primary capacitors range from a normalized first capacitor value C to a next value of 2C and so on.
14. The capacitor array of claim 13 , wherein said reference capacitor is comprised of the combination of the lower valued capacitors in the capacitor array and a dummy capacitor of a value C with a common plate connected to the common node and a switched plate interfaced to a switch that is operable to be switched between first and second reference voltages by said calibration engine wherein, in the second calibration phase, the switched plate of all of the lower valued capacitors and the dummy capacitors are connected to the first reference voltage.
15. The capacitor array of claim 14 , wherein said trim capacitors comprise an array of trim capacitors, each having a common plate connected to the common node and a switched plate interfaced to a trim capacitor switch that is operable to be switched between the first and second reference voltages.
16. The capacitor array of claim 15 , wherein said trim capacitors are binary weighted.
17. The capacitor array of claim 16 , wherein the operation of repeating the first and second calibration phases by said calibration engine utilizes a successive approximation algorithm.
18. The capacitor array of claim 14 , wherein a plurality of the primary capacitors are calibrated, each having an array of trim capacitors associated therewith which are selectable in the first and second calibration phases by said calibration engine.
19. The capacitor array of claim 18 , wherein the final configuration of all of said trim capacitors is stored in a non volatile memory.
20. The capacitor array of claim 19 , wherein the SAR data converter upon power up has the configuration information downloaded from said non volatile memory to configure said trim capacitors.