Contact sensitive device

1. A contact sensitive device comprising:

a member capable of supporting bending waves;

a sensor mounted on the member for measuring bending wave vibration in the member to determine a first measured bending wave signal;

at least a second sensor to determine a second measured bending wave signal; and

a processor configured to optimise a product of a set of corrected impulse response measurements from each sensor to determine information related to a contact.

2. A contact sensitive device according to claim 1 wherein the second measured bending wave signal is measured simultaneously with the first measured bending wave signal.

3. A contact sensitive device according to claim 1 , wherein a corrected impulse response measurement is calculated by calculating a Fourier transform of the measured bending wave signal, calculating an equivalent response from a notional sensor positioned at a contact site and calculating an inverse Fourier transform of an equivalent response to provide a function to be optimised.

4. A contact sensitive device according to claim 3 , wherein the optimisation maximum value of the product is obtained.

5. A contact sensitive device according to claim 4 , wherein an initial estimate of the location and the time is derived from impulse response functions whose high frequency components have been suppressed.

6. A contact sensitive device according to claim 1 , wherein the processor is configured to determine the contact position by using knowledge of the periodicity of a pattern on the surface of the member.

7. A contact sensitive device according to claim 6 wherein an interval between impulses represents the time in which a contact has travelled to an adjacent feature of the pattern.

8. A contact sensitive device according to claim 1 , wherein the device includes a purely passive sensor responsive to measure bending wave signals generated by an initial impact or by frictional movement of the contact.

9. A contact sensitive device according to claim 1 , wherein the device includes an active sensor comprising an emitting transducer.

10. A contact sensitive device according to claim 1 wherein the device includes a dual active and passive sensor and is configured to switch between active and passive sensing modes depending on whether contact is applied to the device.

11. A contact sensitive device according to claim 10 , wherein the device cycles between resting in passive sensing mode when no contact is detected, switching to active mode sensing when a contact is applied and returning to passive sensing mode once the contact is removed to wait for further contacts.

12. A method of determining information related to a contact on a touch sensitive device having a member capable of supporting bending waves, the method comprising:

measuring bending wave vibration in the member to determine a first measured bending wave signal using a sensor mounted on the member;

calculating information relating to the contact from the measured bending wave signal from the sensor;

determining a second measured bending wave signal which is measured using a second sensor; and

optimising a product of a set of corrected impulse response measurements from each sensor to determine information related to the contact.

13. A method as recited in claim 12 wherein the second measured bending wave signal is measured simultaneously with the first measured bending wave signal.

14. A method according to claim 12 , wherein the corrected impulse response measurement is calculated by calculating the Fourier transform of the measured bending wave signal, calculating an equivalent response from a notional sensor positioned at the contact site and calculating the inverse Fourier transform of the equivalent response to provide a function to be optimised.

15. A method according to claim 14 , wherein the optimisation includes iterative refinement of estimates of the location of the contact and the time for which the maximum value of the product is obtained.

16. A method according to claim 15 , wherein an initial estimate is derived from impulse response functions whose high frequency components have been suppressed.

17. A method according to claim 12 , further comprising determining the contact position by using knowledge of periodicity of a pattern on a surface of the member and wherein an interval between impulses represents a time in which the contact has travelled to an adjacent feature of the pattern.

18. A method according to claim 12 , further comprising passively sensing the bending wave vibration and hence the measured bending wave signals are generated by an initial impact or by frictional movement of the contact.

19. A method according to claim 12 , further comprising actively sensing the bending wave vibration using an emitting transducer.

20. A method according to claim 12 wherein the device includes a dual active and passive sensor and the method further comprises switching between active and passive sensing modes according to whether contact is applied to the device.

21. A method according to claim 20 , further comprising resting in passive sensing mode when no contact is detected, switching to active mode sensing when a contact is applied and returning to passive sensing mode once the contact is removed to wait for further contacts.

22. A contact sensitive device comprising:

first means for measuring bending wave vibration in the member to determine a first measured bending wave signal;

second means for determining a second measured bending wave signal; and

means for optimising a product of a set of corrected impulse response measurements from each sensor to determine information related to a contact on the contact sensitive device.

23. A contact sensitive device comprising a member capable of supporting bending waves, a sensor mounted on the member for measuring bending wave vibration in the member to determine a first measured bending wave signal and a processor which calculates information relating to a contact position from the measured bending wave signal from the sensor, wherein a surface of the member comprises a raised pattern whereby a contact drawn across the surface provides a variable force to the member to generate bending waves in the member.

24. A contact sensitive device according to claim 23 , wherein the pattern is periodic.

25. A contact sensitive device according to claim 23 , wherein the pattern is quasi-periodic with a statistically well-defined spatial distribution of undulations.

26. A contact sensitive device according to claim 23 , wherein the raised pattern is random, whereby the contact drawn across the surface generates a random bending wave signal.

27. A contact sensitive device according to claim 23 , wherein the processor is configured to determine the contact position according to a periodicity of the pattern on the surface of the member and according to an interval between impulses, the interval representing a time in which the contact has travelled to an adjacent feature of the pattern.

28. A contact sensitive device according to claim 23 , wherein the device includes a purely passive sensor responsive to measure bending wave signals generated by an initial impact or by frictional movement of the contact.

29. A contact sensitive device according to claim 23 , wherein the device includes an active sensor comprising an emitting transducer.

30. A contact sensitive device according to claim 23 wherein the device includes a dual active and passive sensor and is configured to switch between active and passive sensing modes depending on whether contact is applied to the device.

31. A contact sensitive device according to claim 30 , wherein the device cycles between resting in passive sensing mode when no contact is detected, switching to active mode sensing when a contact is applied and returning to passive sensing mode once the contact is removed to wait for further contacts.

32. A contact sensitive device according to claim 23 further comprising a processor, wherein the processor applies a correction based on the dispersion relation of the material of the member supporting the bending waves, and wherein the contact sensitive device further determines a second measured bending wave signal which is measured simultaneously with the first measured bending wave signal and the processor calculates a dispersion corrected function of the two measured bending wave signals.

33. A contact sensitive device according to claim 32 , wherein the calculated dispersion corrected function is an autocorrelation function.

34. A contact sensitive device as according to claim 32 , further comprising a second sensor measuring the second measured bending wave signal.

35. A contact sensitive device as according to claim 34 , further comprising a second pair of sensors to determine two additional measured bending wave signals from which a second dispersion corrected function is calculated.

36. A contact sensitive device according to claim 35 , wherein the processor determines from each dispersion corrected function a first difference in path-length between the contact site and each of the first and second sensors and a second difference in path-length between the contact site and each of the second pair of sensors and determines the location of the contact from the first and second differences in path-length.

37. A contact sensitive device as according to claim 32 , further comprising multiple sensors on the member whereby multiple dispersion corrected functions are determined.

38. A contact sensitive device according to claim 37 , wherein the processor is configured to create a mapping function which maps the surface of the member for each dispersion corrected function.

39. A contact sensitive device as according to claim 32 , wherein the member is an acoustic radiator and an emitting transducer is mounted to the member to excite bending wave vibration in the member to generate an acoustic output.

40. A contact sensitive device according to claim 39 , further comprising means ensuring that the acoustic output and measured bending wave signals are in discrete frequency bands.

41. A contact sensitive device according to claim 40 , further comprising an adaptive noise canceller for removing the contribution of the acoustic output from the measured bending wave signal.

42. A contact sensitive device as according to claim 32 , further wherein the processor estimates a convolution correction coefficient which is applied to the dispersion corrected function thereby compensating for phase differences between the sensors.

43. A contact sensitive device according to claim 32 , further comprising means for recording sets of first and second measured bending wave signals each sensor over time as the contact moves across the member.

44. A contact sensitive device according to claim 43 , wherein the processor is adapted to analyze the measured bending wave signals as a sequence of frames of data.

45. A contact sensitive device according to claim 44 , wherein the processor is adapted to extract information on the contact which has been averaged over the duration of one of the frames of data.

46. A contact sensitive device as according to claim 32 , wherein the processor comprises an adaptive filter which calculates a convolution function between a set of first measured bending wave signals and a set of second measured bending wave signals.

47. A contact sensitive device according to claim 46 , wherein the processor is adapted to use a dispersion corrected convolution function to calculate information about the contact.

48. A contact sensitive device as according to claim 23 , further comprising absorbers mounted around at least part of the periphery of the member to absorb reflected waves.

49. A contact sensitive device as according to claim 32 , wherein the processor is configured to remove the contribution of reflected waves from the measured bending wave signal.

50. A contact sensitive device according to claim 49 , wherein the processor comprises a low-pass filtering operator which operates on the measured bending wave signal and which comprises an averaging window having a width which varies locally with time.

51. A contact sensitive device according to claim 50 , wherein the processor is configured to provide an estimate for the distance between the contact site and each sensor, the estimate being substituted into a calculation to remove the reflected waves.

52. A contact sensitive device as according to claim 23 , wherein the member is transparent.

53. A contact sensitive device comprising:

a member capable of supporting bending waves;

a sensor mounted on the member for measuring bending wave vibration in the member to determine a first measured bending wave signal;

at least a second sensor to determine a second measured bending wave measured simultaneously with the first measured bending wave signal; and

a processor configured to utilize a set of corrected impulse response measurements from each sensor to determine information related to a contact.

54. A contact sensitive device according to claim 53 wherein the second measured bending wave signal is measured simultaneously with the first measured bending wave signal.

55. A contact sensitive device according to claim 53 , wherein a corrected impulse response measurement is calculated by calculating a Fourier transform of the measured bending wave signal, calculating an equivalent response from a notional sensor positioned at a contact site and calculating an inverse Fourier transform of an equivalent response to provide a function to be optimised.

56. A contact sensitive device according to claim 55 , wherein the optimisation includes iterative refinement of estimates of a location of the contact and a time.

57. A contact sensitive device according to claim 56 , wherein an initial estimate of the location and the time is derived from impulse response functions whose high frequency components have been suppressed.

58. A contact sensitive device according to claim 53 , wherein the processor is configured to determine the contact position by using knowledge of the periodicity of a pattern on the surface of the member.

59. A contact sensitive device according to claim 58 wherein an interval between impulses represents the time in which a contact has travelled to an adjacent feature of the pattern.

60. A contact sensitive device according to claim 53 , wherein the device includes a purely passive sensor responsive to measure bending wave signals generated by an initial impact or by frictional movement of the contact.

61. A contact sensitive device according to claim 53 , wherein the device includes an active sensor comprising an emitting transducer.

62. A contact sensitive device according to claim 53 wherein the device includes a dual active and passive sensor and is configured to switch between active and passive sensing modes depending on whether contact is applied to the device.

63. A contact sensitive device according to claim 62 , wherein the device cycles between resting in passive sensing mode when no contact is detected, switching to active mode sensing when a contact is applied and returning to passive sensing mode once the contact is removed to wait for further contacts.