Tracking temperature change in birefringent materials

1. A method detecting and tracking temperature change of a sample comprising the steps of:

a) providing a sample which presents with an optical axis oriented normal to a surface thereof and which demonstrates uniaxial anisotropy in that the ordinary (no) and extraordinary (ne) indicies of refraction are not equal, said ordinary (no) index of refraction being substantially parallel to said surface and said extraordinary (ne) index of refraction being substantially perpendicular to said surface, said sample further having a depth (d) directed perpendicular to said surface;

b) while said sample is at a first temperature applying a polarized spectroscopic electromagnetic beam to said surface at an oblique to said surface such that it reflects from said sample and such that it experiences birefringence;

c) monitoring the reflected electromagnetic radiation and therefrom effectively determining a first plot of (no−ne,)(d) vs wavelength;

d) changing the temperature of said sample and similarly effectively determining a second plot of (no−ne)(d) vs wavelength; and

e) detecting change in the first and second plots, and interpreting said change in terms of temperature change.

2. A method as in claim 1 in which the angle of incidence of the incident beam of spectroscopic electromagnetic radiation is at between 10 and 85 degrees to said sample surface.

3. A method as in claim 1 in which the temperature change determined in step e is determined in absolute terms.

4. A method detecting and tracking temperature change of a sample comprising the steps of:

a) providing a sample which presents with an optical axis oriented parallel to a surface thereof and which demonstrates uniaxial anisotropy in that the ordinary (no) and extraordinary (ne) indicies of refraction are not equal, said ordinary (no) and extraordinary (ne) indicies of refraction being at ninety degrees to one another in a plane substantially parallel to said surface, said sample having a depth (d) directed substantially perpendicular to said surface;

b) while said sample is at a first temperature applying a polarized incident beam of spectroscopic electromagnetic radiation to said surface other than along a direction coincident with that of either the ordinary (no) or the extraordinary (ne) index of refraction such that it experiences birefringence;

c) monitoring the output spectroscopic electromagnetic radiation therefrom and effectively determining a first plot of (no−ne)(d) vs wavelength;

d) changing the temperature of said sample and similarly effectively determining a second plot of (no−ne)(d) vs wavelength; and

e) detecting change in the first and second plots, and interpreting said change in terms of temperature change.

5. A method as in claim 4 in which the plane of incidence of the incident beam of spectroscopic electromagnetic radiation is at 45 degrees to both the ordinary (no) and extraordinary (ne) indicies of refraction and the angle of incidence is between 10 and 85 degrees.

6. A method as in claim 4 in which the temperature change determined in step e is determined in absolute terms.

7. A method as in claim 4 in which the beam approaches along a normal to the surface of the sample and transmission results are detected.

8. A method as in claim 4 in which the beam approaches along an oblique angle to the surface of the sample and reflection results are detected.

9. A method detecting and tracking temperature change of a sample comprising the steps of:

a) providing a sample which demonstrates biaxial anisotropy in that the ordinary (no) and extraordinary (ne) indicies of refraction are not equal, said sample further having a depth (d) directed perpendicular to said surface;

b) while said sample is at a first temperature applying a polarized spectroscopic electromagnetic beam to said surface along a locus such that it experiences birefringence, and reflects from said sample;

c) monitoring the reflected electromagnetic radiation and therefrom effectively determining a first plot of (no−ne)(d) vs wavelength;

d) changing the temperature of said sample and similarly effectively determining a second plot of (no−ne)(d) vs wavelength; and

e) detecting change in the first and second plots, and interpreting said change in terms of temperature change.