Circuit configuration having a semiconductor switch and a protection circuit

1. A circuit configuration, comprising:

a terminal for a first potential;

a first semiconductor switch with a control terminal and first and second load path terminals;

a protection circuit having a second semiconductor switch with a control terminal and a load path connected between said control terminal of said first semiconductor switch and said terminal for the first potential, and having a drive circuit connected to said second semiconductor switch, said drive circuit being configured to compare a load path voltage across said first semiconductor switch with a first reference voltage or a load current through said first semiconductor switch with a reference current, and to switch on said second semiconductor switch, in each case for a preset and non-varying time period set in advance, in dependence on a comparison result;

a reference voltage source connected in series with said second semiconductor switch, between said control terminal of said first semiconductor switch and said terminal for the first potential; and

a further protection circuit for detecting the load current through said first semiconductor switch element and regulating said first semiconductor switch element in dependence on the load current.

2. The circuit configuration according to claim 1 , wherein said drive circuit includes a comparator configuration and a filter connected between said comparator configuration and said control terminal of said second semiconductor switch.

3. The circuit configuration according to claim 2 , wherein said comparator configuration includes a comparator having a first input terminal connected to said first load path terminal of said first semiconductor switch via a further reference voltage source and a second input terminal connected to said second load path terminal of said first semiconductor switch.

4. The circuit configuration according to claim 2 , wherein said comparator configuration has an output, and said filter has a capacitor connected between said output of said comparator configuration and said control terminal of said second semiconductor switch.

5. The circuit configuration according to claim 1 , which comprises a resistor connected between said control terminal and a load path terminal of said second semiconductor switch.

6. The circuit configuration according to claim 1 , which comprises a bypass switch connected to selectively bypass said reference voltage source.

7. The circuit configuration according to claim 1 , wherein said terminal for the first potential forms one of said load path terminals of said first semiconductor switch.

8. The circuit configuration according to claim 1 , wherein said drive circuit includes a comparator configuration and a high-pass filter connected between said comparator configuration and said control terminal of said second semiconductor switch.

9. A circuit configuration, comprising:

a terminal for a first potential;

a first semiconductor switch with a control terminal and first and second load path terminals; and a protection circuit having a second semiconductor switch with a control terminal and a load path connected between said control terminal of said first semiconductor switch and said terminal for the first potential, and having a drive circuit connected to said second semiconductor switch, said drive circuit being configured to compare a load path voltage across said first semiconductor switch with a first reference voltage or a load current through said first semiconductor switch with a reference current, and to switch on said second semiconductor switch, in each case for a preset and non-varying time period set in advance, in dependence on a comparison result said protection circuit being a first protection circuit and including a second protection circuit having a current measuring configuration for sensing a load current of said first semiconductor switch and a series circuit of a third semiconductor switch and a current source between said control terminal of said first semiconductor switch and said terminal for the first potential, and said third semiconductor switching element being actuated by said current measuring configuration.