IP Library Granted Patent US 7,205,030
Granted Patent B2
US 7,205,030 · App. 10/812,420 · Granted Apr 17, 2007

Method for forming porous film

Assignee: Sanyo Electric Co., Ltd.
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Quick Facts
Patent No.
US 7,205,030
App. No.
10/812,420
Granted
Apr 17, 2007
Kind
B2
Abstract

After applying a film-forming composition containing a polysiloxane, a pore-forming agent, an onium salt, and a solvent onto a semiconductor substrate, the solvent is evaporated from the film-forming composition in a first heat treatment. Then, a second heat treatment is carried out in an inert-gas atmosphere to promote the polymerization of the polysiloxane and thus form a polysiloxane resin film. Thereafter, a third heat treatment is carried out in an oxidizing-gas ambient to form pores in the polysiloxane resin film.

Claims (18)

1. A method of forming a porous film comprising:

applying a film-forming composition containing a polysiloxane, a pore-forming agent, an onium salt, and a solvent onto a substrate,

evaporating said solvent from said film-forming composition in a first heat treatment,

promoting polymerization of said polysiloxane in an inert-gas atmosphere in a second heat treatment, and

vaporizing said pore-forming agent in an oxidizing-gas ambient in a third heat treatment at a temperature that is lower than the temperature of the polymerization-promoting second heat treatment.

2. The method of forming a porous film according to claim 1 , including evaporating the solvent in the first heat-treatment in an inert-gas atmosphere at a temperature not exceeding 350° C.

3. The method of forming a porous film according to claim 1 , including promoting polymerization in the second heat-treatment at a temperature not exceeding 400° C.

4. The method of forming a porous film according to claim 1 , including promoting polymerization in the second heat-treatment at a temperature not exceeding 350° C.

5. The method of forming a porous film according to claim 1 , wherein said oxidizing-gas ambient includes oxygen.

6. The method of forming a porous film according to claim 5 , wherein said oxygen contains one of ozone and oxygen radicals.

7. The method of forming a porous film according to claim 1 , wherein said polysiloxane is a hydrolytic condensation product of a compound represented by the general formula (1):

R n SiX 4−n   (1)

wherein R represents a hydrogen atom or an organic group having from 1 to 20 carbon atoms, X represents hydrolysable groups which may be the same as or different from each other, and n represents an integer from 0 to 2, with the proviso that when n is 2, R may be the same or different moieties.

8. The method of forming a porous film according to claim 7 , wherein the weight-average molecular weight of said polysiloxane ranges from 300 to 20,000.

9. The method of forming a porous film according to claim 1 , wherein said pore-forming agent is a polymer having an alkylene-oxide structure with a weight-average molecular weight of from 200 to 10,000.

10. The method of forming a porous film according to claim 1 , wherein said onium salt is an ammonium salt.

11. The method of forming a porous film according to claim 1 , wherein said solvent is selected from the group consisting of an alkylene glycol dialkyl ether and a dialkylene glycol dialkyl ether.

12. The method of forming a porous film according to claim 1 , wherein said substrate is a semiconductor substrate.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 20, 2005
From: SEMICONDUCTOR LEADING EDGE TECHNOLOGIES, INC.
To: SANYO ELECTRIC CO., LTD.
Reel/Frame 016041/0608 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 15, 2004
From: MISAWA, KAORI; MATSUMOTO, ISAO; OHASHI, NAOFUMI; ABE, KOICHI; SAKURAI, HARUAKI
To: SEMICONDUCTOR LEADING EDGE TECHNOLOGIES, INC.
Reel/Frame 015462/0839 →
Priority Claims (1)
JP 2003-099670 · Apr 2, 2003 · national
Continuity (1)
Related Publication 20040213911A1 · Oct 28, 2004