IP Library Granted Patent US 7,307,784
Granted Patent B2
US 7,307,784 · App. 10/506,107 · Granted Dec 11, 2007

High-stability optical microscope

Assignee: Japan Science and Technology Agency
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Quick Facts
Patent No.
US 7,307,784
App. No.
10/506,107
Granted
Dec 11, 2007
Kind
B2
Abstract

This invention provides a highly stable optical microscope that prevents drift and makes it possible to record images or take measurements for several hours with accuracy in the order of nanometers. The highly stable optical microscope of this invention includes the support structure ( 41 ) that accommodates and supports components including the optical imaging system, straight tube ( 28 ) that accommodates and supports components including the optical photometric system, and support structure ( 7 ) that accommodates and supports components including the illumination system. These support structures have a hollow pyramid or conical shape with a low center of gravity. The highly stable optical microscope of this invention features the objective lenses, imaging lenses, optical imaging and photometric systems that are mounted, forming a straight line, on the supporting structures that are symmetrical about the optical axis in both shape and mass.

Claims (17)

1. A highly stable optical microscope,

wherein an objective lens, an imaging lens, an optical imaging and a photometric system are mounted without deviation, forming one single straight line, on a straight guide mechanism and a hollow support structure, surrounding the straight guide mechanism, that are symmetrical about an optical axis in both shape and mass; and

the support structure for the optical imaging and photometric system is a square truncated pyramid or a circular truncated cone to prevent changes in inclination due to temperature fluctuations and vibration.

2. The highly stable optical microscope as claimed in claim 1 ,

wherein a sample base and the objective lens, arranged symmetrically in shape and mass about the optical axis, are integrated and supported by support structures that are independent of all imaging lenses and are integrated at a low center of gravity close to a vibration isolating table.

3. The highly stable optical microscope as claimed in claim 1 ,

wherein in an infinity corrected optical microscope, a half mirror and the imaging lens are combined and mounted at the inlet of an optical illumination system and an optical monitor system respectively, and

wherein the optical illumination system is a combination of at least an incident-light fluorescence, a total internal reflection fluorescence, a transmitted light fluorescence, an incident polarized light, a transmitted polarized light, a bright field incidence, and an optical tweezer.

4. The highly stable optical microscope as claimed in claim 3 ,

wherein a sample base and the objective lens, arranged symmetrically in shape and mass about the optical axis, are integrated and supported by support structure that is independent of all imaging lenses and is integrated at a low center of gravity close to a vibration isolating table.

5. The highly stable optical microscope as claimed in claim 3 ,

wherein the half mirror is a dichroic mirror.

6. A highly stable optical microscope,

wherein an objective lens, an imaging lens, an optical imaging and a photometric system are mounted without deviation, while forming a straight line, on a straight guide mechanism and a hollow support structure that are symmetrical about an optical axis in both shape and mass,

wherein a sample base and the objective lens, arranged symmetrically in shape and mass about the optical axis, are integrated and supported by support structures that are independent of all imaging lenses and are integrated at a low center of gravity close to a vibration isolating table;

wherein a half mirror and the imaging lens are combined and mounted at the inlet of an optical illumination system and an optical monitor system respectively, the half mirror being dichroic mirror; and

wherein the optical illumination system is a combination of at least an incident-light fluorescence, a total internal reflection fluorescence, a transmitted light fluorescence, an incident polarized light, a transmitted polarized light, a bright field incidence, and an optical tweezer.

Assignments (2)
RE-RECORD TO CORRECT THE NAME OF THE SECOND ASSIGNOR AND TO CORRECT THE ADDRESS OF THE ASSIGNEE, PREVIOUSLY RECORDED ON REEL 016192 FRAME 0583. Recorded Jul 13, 2005
From: KINOSHITA, KAZUHIKO; SHIO, MEGUMU
To: JAPAN SCIENCE AND TECHNOLOGY AGENCY
Reel/Frame 016517/0653 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 31, 2004
From: KINOSHITA, KAZUHIKO; SHIO, MEGUMI
To: JAPAN SCIENCE AND TECHNOLOGY AGENCY
Reel/Frame 016192/0583 →
Priority Claims (1)
JP 2002-073455 · Mar 18, 2002 · national
Continuity (1)
Related Publication 20050117204A1 · Jun 2, 2005