Semiconductor device and method of producing the same, and power conversion apparatus incorporating this semiconductor device
The temperature of a bipolar semiconductor element using a wide-gap semiconductor is raised using heating means, such as a heater, to obtain a power semiconductor device being large in controllable current and low in loss. The temperature is set at a temperature higher than the temperature at which the decrement of the steady loss of the wide-gap bipolar semiconductor element corresponding to the decrement of the built-in voltage lowering depending on the temperature rising of the wide-gap bipolar semiconductor element is larger than the increment of the steady loss corresponding to the increment of the ON resistance increasing depending on the temperature rising.
1. A semiconductor device comprising:
a wide-gap bipolar semiconductor element using a wide-gap semiconductor having stacking faults including basal plane dislocation, and having a built-in voltage in the forward direction;
a semiconductor package accommodating said wide-gap bipolar semiconductor element and having electrical connection means for connecting said wide-gap bipolar semiconductor element to external apparatuses;
a heater which is provided to the package and heats said wide-gap bipolar semiconductor element inside said semiconductor package to a temperature of 50° C. or more;
a temperature sensor which is provided to the package and detects the temperature of said wide-gap bipolar semiconductor element; and
a temperature controller which controls the heater on the basis of a detection output of said temperature sensor so as to heat said wide-gap bipolar semiconductor element to a temperature of 50° C. or more and less than 200° C. before energization of said wide-gap bipolar semiconductor element, and then starts the energization of said wide-gap bipolar semiconductor element, raising the temperature of said wide-gap bipolar semiconductor element to 200° C. or more by self-heating of said wide-gap bipolar semiconductor element.
2. A semiconductor device in accordance with claim 1 , wherein said heater is an electric heater.
3. A semiconductor device in accordance with claim 1 , wherein said wide-gap bipolar semiconductor element is either a diode having a pn junction or a self-excited thyristor.
4. A semiconductor device in accordance with claim 1 , wherein the semiconductor package comprises a support made of metal, on which the wide-gap bipolar semiconductor element is mounted.
5. A semiconductor device in accordance with claim 4 , wherein the semiconductor package comprises a cap made of metal fixed on the support so as to cover the wide-gap bipolar semiconductor element.
6. A semiconductor device in accordance with claim 4 , wherein the wide-gap bipolar semiconductor element is bonded to a upper face of the support, and
the heater is located on a lower face of the support.
7. A semiconductor device in accordance with claim 4 , wherein the wide-gap bipolar semiconductor element is mounted via an insulation plate on the support, and
the heater is located on a lower face of the support.
8. A semiconductor device in accordance with claim 1 , wherein the semiconductor package comprises a molded heat-resistant resin so as to encapsulate the wide-gap bipolar semiconductor element.
9. A semiconductor device comprising:
a wide-gap bipolar semiconductor element using a wide-gap semiconductor having stacking faults including basal plane dislocation, and having a built-in voltage in the forward direction;
a semiconductor package accommodating said wide-gap bipolar semiconductor element and having electrical connection means for connecting said wide-gap bipolar semiconductor element to external apparatuses;
a heat sink which is provided to the package and controls a radiation of heat generated when the said wide-gap bipolar semiconductor element is energized so as to keep said wide-gap bipolar semiconductor element inside said semiconductor package at a temperature 50° C. or more;
a temperature sensor which is provided to the package and detects the temperature of said wide-gap bipolar semiconductor element; and
a temperature controller that keeps the temperature of said wide-gap bipolar semiconductor element at the temperature of 50° C. or more and less than 200° C. on the basis of a detection output of said temperature sensor by energizing said wide-gap bipolar semiconductor element with an applied current smaller than a rated current so as to generate self-heating of said wide-gap bipolar semiconductor element under control of a radiation of heat from said wide-gap bipolar semiconductor element by the heat sink, and then allows said wide-gap bipolar semiconductor element to be applied with a current up to the rated current so as to raise the temperature of said wide-gap bipolar semiconductor element to 200° C. or more by self-heating of said wide-gap bipolar semiconductor element.