Plasmon wave propagation devices and methods
View Patent ↗Nanoantennas are formed on a substrate (e.g., silicon) and generate light via interactions with a charged particle beam, where the frequency of the generated light is based in large part on the periodicity of the “fingers” that make up the nanoantennas. Each finger has typical dimensions of less than 100 nm on the shorter side and typically less than 500 nm on the longer, but the size of the optimal longer side is determined by the electron velocity. The charged particle may be an electron beam or any other source of charged particles. By utilizing fine-line lithography on the surface of the substrate, the nanoantennas can be formed without the need for complicated silicon devices.
1. An electromagnetic transmitter comprising:
a source of charged particles being emitted in a beam;
a data input for receiving data to be transmitted;
a first resonant structure configured to be excited by particles emitted from the source of charged particles and configured to emit electromagnetic radiation at a first predominant frequency representing the data to be transmitted, wherein the first predominant frequency has a frequency higher than that of a microwave frequency; and
a bias source for biasing the first resonant structure to deflect the charged particles away from the first resonant structure to reduce an amount of resonance imparted to the first resonant structure by the charged particles.
2. The electromagnetic transmitter as claimed in claim 1 , wherein the charged particles emitted from the source of charged particles comprise electrons.
3. The electromagnetic transmitter as claimed in claim 1 , further comprising:
a second resonant structure configured to be excited by the charged particles and configured to emit electromagnetic radiation at a second predominant frequency, wherein the second predominant frequency has a frequency higher than that of a microwave frequency; and
at least one deflector having a control terminal for selectively exciting the first and second resonant structures by the charged particles.
4. The electromagnetic transmitter as claimed in claim 3 , wherein the bias source biases the first resonant structure without biasing the second resonant structure.
5. The electromagnetic transmitter as claimed in claim 3 , wherein the bias source biases the first resonant structure and the second resonant structure simultaneously.
6. The electromagnetic transmitter as claimed in claim 3 , wherein the at least one deflector comprises at least two deflectors, wherein the first deflector deflects the charged particles in a first direction and the second deflector deflects the charged particles in a second direction.
7. The electromagnetic transmitter as claimed in claim 3 , wherein the first deflector and second deflectors are on opposite sides of the beam of charged particles.
8. The electromagnetic transmitter as claimed in claim 3 , wherein the first deflector and second deflectors are on the same side of the beam of charged particles.
9. The electromagnetic transmitter as claimed in claim 1 , further comprising a focusing element for focusing the charged particles along a path that causes the first resonant structure to resonate.