IP Library Granted Patent US 7,847,310
Granted Patent B2
US 7,847,310 · App. 12/250,405 · Granted Dec 7, 2010

Migration enhanced epitaxy fabrication of active regions having quantum wells

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Quick Facts
Patent No.
US 7,847,310
App. No.
12/250,405
Granted
Dec 7, 2010
Kind
B2
Abstract

Semiconductor lasers, such as VCSELs having active regions with flattening layers associated with nitrogen-containing quantum wells are disclosed. MEE (Migration Enhanced Epitaxy) is used to form a flattening layer upon which a quantum well is formed and thereby enhance smoothness of quantum well interfaces and to achieve narrowing of the spectrum of light emitted from nitrogen containing quantum wells. A cap layer is also formed over the quantum well.

Claims (35)

1. An active region associated with a semiconductor laser, comprising:

a first flattening layer comprising a first section having from about 7 to about 73 alternating monolayers of group III and group V elements;

a nitrogen containing quantum well formed on the flattening layer, wherein the flattening layer is grown with a flux of group V elements and the quantum well is grown with a higher flux of group V elements than at least a portion of the monolayers of the flattening layer; and

a cap layer formed on the quantum well;

a plurality of additional quantum wells, wherein each quantum well has a flattening layer on a first surface thereof and a cap layer on a second surface thereof.

2. An active region as defined in claim 1 , wherein the flattening layer is substantially nitrogen free.

3. An active region as defined in claim 1 , wherein the cap layer comprises GaAs.

4. An active region as defined in claim 1 , wherein the cap layer comprises GaAsN.

5. An active region as defined in claim 1 , wherein the quantum well comprises InGaAsN.

6. An active region as defined in 1 , wherein the quantum well comprises InGaAsNSb.

7. An active region as defined in claim 1 , wherein the quantum well comprises InGaAsN.

8. A VCSEL comprising an active region as defined in claim 1 .

9. A VCSEL as defined in claim 8 , further comprising:

a GaAs substrate; a GaAs/AlGaAs lower Bragg reflector formed on the substrate;

a lower cladding layer formed on the lower Bragg reflector;

the active region as defined in claim 1 formed on the lower cladding region, wherein the group III constituent comprises Ga and the group V constituent comprises As;

an upper cladding layer formed on the active region; and

a GaAs upper Bragg reflector formed on the upper cladding layer.

10. An active region associated with a semiconductor laser, comprising:

a plurality of nitrogen containing quantum wells, each quantum well having a flattening layer on a first surface thereof and a cap layer on a second surface thereof,

the flattening layer comprising a first section having from about 7 to about 73 alternating monolayers of group III and group V elements; and

the quantum well comprising InGaAsN and being formed on the flattening layer, wherein the flattening layer is grown with a flux of group V elements and the quantum well is grown with a higher flux of group V elements than at least a portion of the monolayers of the flattening layer.

11. An active region as defined in claim 10 , wherein the flattening layer is substantially nitrogen free.

12. An active region as defined in claim 10 , wherein the cap layer comprises GaAs.

13. An active region as defined in claim 10 , wherein the cap layer comprises GaAsN.

14. An active region as defined in claim 10 , wherein the quantum well comprises InGaAsN.

15. An active region as defined in 10 , wherein the quantum well comprises InGaAsNSb.

16. A VCSEL comprising an active region as defined in claim 10 .

17. A VCSEL as defined in claim 16 , further comprising:

a GaAs substrate;

a GaAs/AlGaAs lower Bragg reflector formed on the substrate;

a lower cladding layer formed on the lower Bragg reflector;

the active region as defined in claim 11 formed on the lower cladding region, wherein the group III constituent comprises Ga and the group V constituent comprises As;

an upper cladding layer formed on the active region; and

a GaAs upper Bragg reflector formed on the upper cladding layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 1, 2020
From: FINISAR CORPORATION
To: II-VI DELAWARE, INC.
Reel/Frame 052286/0001 →