IP Library Granted Patent US 7,972,899
Granted Patent B2
US 7,972,899 · App. 12/462,146 · Granted Jul 5, 2011

Method for fabricating copper-containing ternary and quaternary chalcogenide thin films

Assignee: Sisom Thin Films LLC
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Quick Facts
Patent No.
US 7,972,899
App. No.
12/462,146
Granted
Jul 5, 2011
Kind
B2
Abstract

An apparatus for depositing a solid film onto a substrate from a reagent solution includes reservoirs of reagent solutions maintained at a sufficiently low temperature to inhibit homogeneous reactions within the reagent solutions. The chilled solutions are dispensed through showerheads, one at a time, onto a substrate. One of the showerheads includes a nebulizer so that the reagent solution is delivered as a fine mist, whereas the other showerhead delivers reagent as a flowing stream. A heater disposed beneath the substrate maintains the substrate at an elevated temperature at which the deposition of a desired solid phase from the reagent solutions may be initiated. Each reagent solution contains at least one metal and either S or Se, or both. At least one of the reagent solutions contains Cu. The apparatus and its associated method of use are particularly suited to forming films of Cu-containing compound semiconductors.

Claims (28)

1. A method for depositing a solid film onto a substrate from a reagent solution comprising the steps of:

providing a supply of a first reagent solution maintained at a first temperature at which homogeneous reactions are substantially inhibited within said first reagent solution;

dispensing a fine mist of said first reagent solution from a first showerhead assembly;

positioning said substrate to receive at least a portion of said fine mist of said first reagent over a selected area of said substrate;

providing a supply of a second reagent solution maintained at a second temperature at which homogeneous reactions are substantially inhibited within said second reagent solution;

dispensing a flowing stream of said second reagent solution from a second showerhead assembly;

positioning said substrate to receive at least a portion of said flowing stream of said second reagent over a selected area of said substrate;

providing a raised structure peripheral to said selected area whereby a controlled volume of said second reagent solution may be maintained upon said substrate; and,

heating said substrate and said controlled volume of said second reagent solution upon said substrate to a selected temperature, higher than at least one of said first and said second temperatures, so that deposition of a desired solid phase from said reagent solutions may be initiated.

2. The method of claim 1 wherein said solid film comprises a compound semiconductor comprising Cu, at least one other metal, and at least one nonmetal selected from the group consisting of S and Se.

3. The method of claim 2 wherein said compound semiconductor is selected from the group consisting of: CuSbS, CuSbSSe, CuInSSe, CuSnZnSe, CuInGaSSe, CuInGaS, CuAlS, CuAlSSe, CuFeS, CuFeSSe, CuLiS, CuLiSSe, CuGaS, CuGaSSe, CuSnS, CuSnSSe, CuZnS, CuZnSSe, CuAlMgS, CuAlMgSSe, CuCdS, CuCdSSe, CuCdSnS, and CuCdSnSSe.

4. The method of claim 2 wherein the composition of said solid film varies in a direction normal to a surface of said substrate.

5. The method of claim 2 wherein at least one electronic characteristic of said solid film varies in a direction normal to a surface of said substrate.

6. The method of claim 5 wherein said at least one electronic characteristic of said solid film is selected from the group consisting of: bandgap, carrier concentration, carrier mobility, and resistivity.

7. The method of claim 1 wherein said fine mist of said first reagent has an average droplet size less than about 50 μm.

8. The method of claim 1 wherein said selected temperature is at least 60° C. higher than said first and second temperatures.

9. The method of claim 1 further including the step of:

annealing said deposited film at an annealing temperature greater than said selected temperature.

10. The method of claim 9 wherein said annealing temperature is at least 200° C.

11. A method for forming a compound semiconductor film on a substrate from a reagent solution comprising the steps of:

providing a supply of a first reagent solution, containing at least one metal and at least one nonmetal selected from the group consisting of S and Se, maintained at a first temperature at which homogeneous reactions are substantially inhibited within said first reagent solution;

dispensing a fine mist of said first reagent solution from a first showerhead assembly;

positioning said substrate to receive at least a portion of said fine mist of said first reagent over a selected area of said substrate;

providing a supply of a second reagent solution, containing at least one metal and at least one nonmetal selected from the group consisting of S and Se, maintained at a second temperature at which homogeneous reactions are substantially inhibited within said second reagent solution, wherein at least one of said first and said second reagent solutions contains copper;

dispensing a flowing stream of said second reagent solution from a second showerhead assembly;

positioning said substrate to receive at least a portion of said flowing stream of said second reagent over a selected area of said substrate;

providing a raised structure peripheral to said selected area whereby a controlled volume of said second reagent solution may be maintained upon said substrate; and,

heating said substrate and said controlled volume of said second reagent solution upon said substrate to a selected temperature, higher than at least one of said first and said second temperatures, so that deposition of a desired copper-containing solid phase from said reagent solutions may be initiated.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 13, 2014
From: SISOM THIN FILMS LLC
To: QUANTUMSCAPE CORPORATION
Reel/Frame 032073/0026 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 14, 2012
From: OLADEJI, ISAIAH O.
To: SISOM THIN FILMS, LLC
Reel/Frame 029405/0667 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 19, 2010
From: OLADEJI, ISAIAH O.
To: SISOM THIN FILMS, LLC
Reel/Frame 023969/0538 →
Continuity (1)
Related Publication 20110027940A1 · Feb 3, 2011