Substrate cleaning processes through the use of solvents and systems
A method for removing common contaminates or residues which include but are not limited to ionic residues, particulate residues and moisture from semiconductor wafers used in the manufacture of IC (integrated circuits), liquid crystal displays and flat panel displays. The process includes the use of certain esters or certain esters combined with particular co-solvents. The cleaning method may be utilized in a variety of cleaning processes or process steps and offers economic and performance advantages.
1. A method for drying a semiconductor wafer, consisting of:
contacting a semiconductor wafer surface with a solvent consisting of (i) methyl acetate or (ii) a mixture of about 75/25 weight percent of methyl acetate and isopropyl alcohol to dry the semiconductor wafer by removing moisture from the semiconductor wafer surface.
2. The method according to claim 1 , wherein the solvent is methyl acetate.
3. The method according to claim 1 , wherein the solvent is a mixture of about 75/25 weight percent of methyl acetate and isopropyl alcohol.
4. A method for drying a semiconductor wafer, consisting of:
contacting a semiconductor wafer surface with a solvent consisting of (i) methyl acetate, (ii) a mixture of about 50/50 weight percent of methyl acetate and isopropyl alcohol, or (iii) a mixture of about 75/25 weight percent of methyl acetate and isopropyl alcohol to dry the semiconductor wafer by removing moisture from the semiconductor wafer surface.
5. The method according to claim 4 , wherein the solvent is methyl acetate.
6. The method according to claim 4 , wherein the solvent is a mixture of about 50/50 weight percent of methyl acetate and isopropyl alcohol.
7. The method according to claim 4 , wherein the solvent is a mixture of about 75/25 weight percent of methyl acetate and isopropyl alcohol.
8. A method for cleaning a semiconductor wafer, consisting of:
contacting a semiconductor wafer surface with a solvent consisting of: (i) methyl acetate or (ii) a mixture of about 75/25 weight percent of methyl acetate and isopropyl alcohol to clean the semiconductor wafer by removing particle contamination from the semiconductor wafer surface.
9. The method according to claim 8 , wherein the solvent is methyl acetate.
10. The method according to claim 8 , wherein the solvent is a mixture of about 75/25 weight percent of methyl acetate and isopropyl alcohol.
11. A method for drying a semiconductor wafer, consisting of:
contacting a semiconductor wafer surface with a solvent consisting of (i) methyl acetate or (ii) a mixture of about 75/25 weight percent of methyl acetate and isopropyl alcohol, and (iii) at least one compound selected from the group consisting of:
(a) a sulfonic acid compound having structure R 11 SO 3 H, wherein R 11 is selected from C 1 -C 20 -alkyl, C 3 -C 8 -cycloalkyl, and aryl;
(b) a quaternary ammonium salt having structure R 12 , R 13 , R 14 , R 15 , NX, wherein R 12 , R 13 , R 14 , and R 15 independently represent C 1 -C 6 alkyl groups optionally substituted with aryl groups and X is an anion selected from chloride, bromide, iodide, hydroxide, hydrogen sulfate, and sulfate; and
(c) a nonionic surfactant compound;
to dry the semiconductor wafer by removing moisture from the semiconductor wafer surface.
12. A method for cleaning a semiconductor wafer, consisting of:
contacting a semiconductor wafer surface with a solvent consisting of (i) methyl acetate, (ii) a mixture of about 50/50 weight percent of methyl acetate and isopropyl alcohol, or (iii) a mixture of about 75/25 weight percent of methyl acetate and isopropyl alcohol, and (iii) at least one compound selected from the group consisting of:
(a) a sulfonic acid compound having structure R 11 SO 3 H, wherein R 11 is selected from C 1 -C 20 -alkyl, C 3 -C 8 -cycloalkyl, and aryl;
(b) a quaternary ammonium salt having structure R 12 , R 13 , R 14 , R 15 , NX, wherein R 12 , R 13 , R 14 , and R 15 independently represent C 1 -C 6 alkyl groups optionally substituted with aryl groups and X is an anion selected from chloride, bromide, iodide, hydroxide, hydrogen sulfate, and sulfate; and
(c) a nonionic surfactant compound;
to clean the semiconductor wafer by removing residual ionic contamination from the semiconductor wafer surface.
13. A method for cleaning a semiconductor wafer, consisting of:
contacting a semiconductor wafer surface with a solvent consisting of: (i) methyl acetate or (ii) a mixture of about 75/25 weight percent of methyl acetate and isopropyl alcohol, and (iii) at least one compound selected from the group consisting of:
(a) a sulfonic acid compound having structure R 11 SO 3 H, wherein R 11 is selected from C 1 -C 20 -alkyl, C 3 -C 8 -cycloalkyl, and aryl;
(b) a quaternary ammonium salt having structure R 12 , R 13 , R 14 , R 15 , NX, wherein R 12 , R 13 , R 14 , and R 15 independently represent C 1 -C 6 alkyl groups optionally substituted with aryl groups and X is an anion selected from chloride, bromide, iodide, hydroxide, hydrogen sulfate, and sulfate; and
(c) a nonionic surfactant compound;
to clean the semiconductor wafer by removing particle contamination from the semiconductor wafer surface.
14. The method according to any one of claims 11 , 12 , or 13 , wherein the at least one compound is present in an amount of 0.001 to 1.0 weight percent.