Arc detection using discrete wavelet transforms
View Patent ↗An apparatus to perform series and parallel arc fault current interruption (AFCI). The apparatus includes a resistive element configured to sense a load from which a current signal is generated, a first detection unit configured to output a first signal based on the current signal, and a microcontroller configured to decompose at least the first signal via discrete wavelet transforms to thereby obtain discrete wavelet coefficients, and to generate a trip signal when the discrete wavelet coefficients indicate that a threshold condition for trip signal generation are satisfied.
1. An apparatus to perform series and parallel arc fault current interruption (AFCI), the apparatus comprising:
a current sensing device configured to sense an electrical load current, the current sensing device being further configured to produce an output signal representative of the electrical load current;
a first detection unit configured to output a first signal based on the output signal; and
a microcontroller configured to decompose at least the first signal via discrete wavelet transforms to thereby obtain discrete wavelet coefficients by which parallel and series arc are identified, and to generate a trip signal when the discrete wavelet coefficients indicate that a threshold condition for trip signal generation is satisfied.
2. The apparatus according to claim 1 , further comprising a second detection unit disposed in parallel with the first detection unit and configured to output a second signal based on the output current signal.
3. The apparatus according to claim 1 , further comprising a current measurement unit disposed in parallel with the first detection unit and configured to output a measurement signal, which is based on the output current signal, such that the threshold condition for trip signal generation are is a function of the current measurement.
4. The apparatus according to claim 2 , further comprising a current measurement unit disposed in parallel with the first and second detection units and configured to output a measurement signal, which is based on the output current signal, such that the threshold condition for trip signal generation is a function of the current measurement.
5. The apparatus according to claim 1 , further comprising a summing amplifier operably disposed between the resistive element and the first detection unit, wherein the microcontroller is coupled to the summing amplifier.
6. The apparatus according to claim 1 , further comprising an ambient temperature sensor coupled to the microcontroller by which the microcontroller determines whether to compensate for temperature changes of the resistive element.
7. The apparatus according to claim 1 , wherein the first detection unit operates at a sampling rate of 300 kHz and filters all but those sub-signals having frequencies of about 6 kHz-60 Hz from the output current signal.
8. The apparatus according to claim 7 , wherein the first detection unit comprises a series arc detection unit and includes a set of filters in series.
9. The apparatus according to claim 2 , wherein the second detection unit operates at a sampling rate of 10 kHz and filters all but those sub-signals having frequencies of about 150-900 Hz from the output current signal.
10. The apparatus according to claim 9 , wherein the second detection unit comprises a parallel arc detection unit and includes a set of filters in series.
11. The apparatus according to claim 3 , wherein the current measurement unit operates at a sampling rate of 10 kHz.
12. The apparatus according to claim 6 , further comprising a test switch coupled to the microcontroller in electric parallel with the ambient temperature sensor for permitting selective testing of the apparatus, the test switch including a series arc test configuration and a parallel arc test configuration.
13. An apparatus to perform series and parallel arc fault current interruption (AFCI), the apparatus comprising:
a resistive element configured to sense a load from which a current signal is generated;
a series arc detection unit configured to output a series arc detection signal based on the current signal;
a parallel arc detection unit electrically disposed in parallel with the series arc detection unit and configured to output a parallel arc detection signal based on the current signal;
a microcontroller configured to decompose the series arc and parallel arc detection signals via discrete wavelet transforms to thereby obtain discrete wavelet coefficients, and to generate a trip signal when the discrete wavelet coefficients indicate that a threshold condition for trip signal generation is satisfied.
14. The apparatus according to claim 13 , further comprising a current measurement unit electrically disposed in parallel with the series arc and parallel arc detection units and configured to output a measurement signal, which is based on the current signal, such that the threshold condition for trip signal generation is a function of the current measurement.
15. The apparatus according to claim 14 , wherein the series arc detection unit comprises a high pass filter and two low pass filters in electric series, the parallel arc detection unit comprises a low frequency bandpass filter and a high pass filter in electric series and the current measurement unit comprises a low pass filter.
16. The apparatus according to claim 14 , further comprising a summing amplifier operably disposed between the resistive element and the series arc and parallel arc detection units and the current measurement unit, wherein the microcontroller is coupled to the summing amplifier.
17. The apparatus according to claim 13 , further comprising an ambient temperature sensor coupled to the microcontroller by which the microcontroller determines whether to compensate for temperature changes of the resistive element.
18. The apparatus according to claim 17 , further comprising a test switch coupled to the microcontroller in electric parallel with the ambient temperature sensor for permitting selective testing of the apparatus, the test switch including a series arc test configuration and a parallel arc test configuration.