IP Library Granted Patent US 8,266,944
Granted Patent B2
US 8,266,944 · App. 12/478,811 · Granted Sep 18, 2012

Method for evaluating scratch resistance of plastic resins

Assignee: Cheil Industries Inc.
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Quick Facts
Patent No.
US 8,266,944
App. No.
12/478,811
Granted
Sep 18, 2012
Kind
B2
Abstract

Disclosed herein is a method for evaluating scratch resistance of a plastic resin comprising scratching a surface of a test sample of plastic resin using a scratch apparatus to form a scratch of the surface having a scratch profile; scanning the scratched test sample with a surface profile analysis apparatus to measure the scratch profile; and creating a scratch resistance evaluation index based on the measured scratch profile to evaluate the scratch resistance of the test sample. The method has good reliability and reproducibility, reduces measurement time and errors caused by measurers and measuring conditions, provides easy measurement and can be widely applied to all plastic resins.

Claims (12)

1. A method for evaluating a scratch resistance of a plastic resin, comprising:

scratching a surface of a test sample of the plastic resin using a scratch apparatus to form a scratch on the surface having a scratch profile;

scanning the scratched test sample with a surface profile analysis apparatus to measure the scratch profile; and

determining a scratch resistance evaluation index based on the measured scratch profile to evaluate the scratch resistance of the test sample,

wherein said scratch profile comprises (a) a scratch width, (b) a scratch depth, (c) a maximum hill-to-valley range and (d) a profile area, and wherein said scratch resistance evaluation index is based upon the measured scratch width, scratch depth, maximum hill-to-valley range and profile area of the scratch index.

2. The method of claim 1 , wherein said scratch apparatus scratches the surface of the test sample with a load ranging from about 1 g to about 3,000 g and at a rate less than or equal to about 300 mm/min.

3. The method of claim 1 , wherein said surface profile analysis apparatus is a contact type or a non-contact type surface profile analysis apparatus.

4. The method of claim 3 , wherein said contact type surface profile analysis apparatus scans said scratched surface of said test sample with a metal stylus tip having a diameter ranging from about 0.5 μm to about 2 μm to measure said scratch profile.

5. The method of claim 3 , wherein said non-contact type surface profile analysis apparatus is a three-dimensional microscope or an optical analyzer.

6. The method of claim 3 , wherein said surface profile analysis apparatus has a horizontal scan length ranging from about 1 mm to about 30 mm, a vertical scan length ranging from about 1 μm to about 100 μm and a vertical resolution ranging from about 1 Å to about 30 Å.

7. The method of claim 1 , wherein (a) said scratch width ranges from about 0 μm to about 1,400 μm, (b) said scratch depth ranges from about 0 μm to about 300 μm, (c) said maximum hill-to-valley range ranges from about 0 μm to about 500 μm and (d) said profile area ranges from about 0 μm 2 to about 155,000 μm 2 .

8. The method of claim 1 , wherein said scratch resistance is evaluated by measuring the scratch profile at least about 2 times to about 5 times, and calculating an average value of the scratch resistance evaluation index.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 30, 2017
From: SAMSUNG SDI CO., LTD.
To: LOTTE ADVANCED MATERIALS CO., LTD.
Reel/Frame 042114/0895 →
MERGER Recorded Jul 14, 2016
From: CHEIL INDUSTRIES INC.
To: SAMSUNG SDI CO., LTD.
Reel/Frame 039360/0858 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 5, 2009
From: KWON, KEE HAE; KIM, IL JIN; MOON, HYUNG RANG; PARK, JAE BUM; KONG, SEONG HO; KWON, O SUNG
To: CHEIL INDUSTRIES INC.
Reel/Frame 022785/0343 →
Priority Claims (1)
KR 2006-0137061 · Dec 28, 2006 · national
Continuity (2)
Continuation In Part PCTKR2007006986 · Dec 28, 2007
Related Publication 20090293585A1 · Dec 3, 2009