IP Library Granted Patent US 8,319,243
Granted Patent B2
US 8,319,243 · App. 13/317,102 · Granted Nov 27, 2012

Nitride semiconductor light-emitting device and method of manufacturing the same

Assignee: Sharp Kabushiki Kaisha
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Quick Facts
Patent No.
US 8,319,243
App. No.
13/317,102
Granted
Nov 27, 2012
Kind
B2
Abstract

A nitride semiconductor light-emitting device including a reflecting layer made of a dielectric material, a transparent conductive layer, a p-type nitride semiconductor layer, a light emitting layer and an n-type nitride semiconductor layer in this order and a method of manufacturing the same are provided. The transparent conductive layer is preferably made of a conductive metal oxide or an n-type nitride semiconductor, and the reflecting layer made of a dielectric material preferably has a multilayer structure obtained by alternately stacking a layer made of a dielectric material having a high refractive index and a layer made of a dielectric material having a low refractive index.

Claims (50)

1. A nitride semiconductor light-emitting device comprising:

a reflecting layer, a transparent conductive layer, and a nitride semiconductor layer including a p-type nitride semiconductor layer, a light emitting layer and an n-type nitride semiconductor layer in this order,

wherein said reflecting layer includes a layer having a smaller critical angle of total reflection than said transparent conductive layer at an interface with the transparent conductive layer, and

wherein said layer having a smaller critical angle of total reflection than said transparent conductive layer has a through-port passing therethrough in a thickness direction in a region located immediately under said transparent conductive layer.

2. The nitride semiconductor light-emitting device according to claim 1 , wherein said layer having a smaller critical angle of total reflection than said transparent conductive layer is made of SiO 2 .

3. The nitride semiconductor light-emitting device according to claim 1 , wherein said transparent conductive layer is made of a conductive metal oxide.

4. The nitride semiconductor light-emitting device according to claim 1 , wherein said transparent conductive layer is made of an n-type nitride semiconductor.

5. The nitride semiconductor light-emitting device according to claim 1 , wherein said reflecting layer has a reflectance of 80 to 100% with respect to light emitted from said light emitting layer.

6. The nitride semiconductor light-emitting device according to claim 1 , wherein a first surface of the nitride semiconductor layer provided with said reflecting layer is planar.

7. The nitride semiconductor light-emitting device according to claim 1 , wherein

a second surface of the nitride semiconductor layer opposite to a first surface of the nitride semiconductor layer is irregularized.

8. The nitride semiconductor light-emitting device according to claim 1 , wherein

a length of said transparent conductive layer in a direction perpendicular to a thickness direction is smaller than a length of said p-type nitride semiconductor layer in a direction perpendicular to a thickness direction, and

said reflecting layer is in contact with side surfaces of said transparent conductive layer and a surface of said transparent conductive layer closer to said reflecting layer and further in contact with a part of a surface of said p-type nitride semiconductor layer closer to said transparent conductive layer, said part of a surface being not in contact with said transparent conductive layer.

9. The nitride semiconductor light-emitting device according to claim 1 , wherein a thickness of said reflecting layer is 0.2 to 5 μm.

10. The nitride semiconductor light-emitting device according to claim 1 , further comprising:

a support substrate,

wherein said support substrate, said reflecting layer, said transparent conductive layer, said p-type nitride semiconductor layer, said light emitting layer, and said n-type nitride semiconductor layer are disposed in this order.

11. The nitride semiconductor light-emitting device according to claim 10 , further comprising:

a eutectic bonding layer having a single- or multilayer structure made of a metal including a eutectic bonding metal or an alloy containing said metal between said support substrate and said reflecting layer.

12. The nitride semiconductor light-emitting device according to claim 11 , further comprising:

an adhesion layer between said reflecting layer and said eutectic bonding layer.

13. The nitride semiconductor light-emitting device according to claim 10 , wherein said support substrate is a substrate made of a plated metal or alloy.

14. A method of manufacturing the nitride semiconductor light-emitting device according to claim 10 , the method comprising:

(A) stacking said n-type nitride semiconductor layer, said light emitting layer, and said p-type nitride semiconductor layer on a growth substrate in this order;

(B) forming said transparent conductive layer on the surface of said p-type nitride semiconductor layer;

(C) forming said reflecting layer on an exposed surface of an obtained laminate;

(D) stacking said support substrate;

(E) removing said growth substrate; and

(F) obtaining a plurality of nitride semiconductor light-emitting devices by performing chip division.

15. The method of manufacturing the nitride semiconductor light-emitting device according to claim 14 , further comprising:

(G) partially exposing said transparent conductive layer by forming a through-port passing through said reflecting layer in the thickness direction in said reflecting layer after step (C).

16. The method of manufacturing the nitride semiconductor light-emitting device according to claim 15 , wherein said through-port is formed by etching and said transparent conductive layer functions as an etching stopper layer in step (G).

17. The method of manufacturing a nitride semiconductor light-emitting device according to claim 14 , further comprising:

(H) exposing said reflecting layer by forming recesses substantially at a constant interval from a side of said n-type nitride semiconductor layer between steps (E) and (F).

18. The method of manufacturing a nitride semiconductor light-emitting device according to claim 17 , wherein said chip division is performed on positions on bottom surfaces of said recesses in step (F).

19. The method of manufacturing a nitride semiconductor light-emitting device according to claim 14 , further comprising:

(I) irregularizing a surface of said n-type nitride semiconductor layer after step (E).

20. A nitride semiconductor light-emitting device comprising:

a reflecting layer, a transparent conductive layer, and a nitride semiconductor layer including a p-type nitride semiconductor layer, a light emitting layer, and an n-type nitride semiconductor layer in this order,

wherein said reflecting layer includes a layer having a smaller critical angle of total reflection than said transparent conductive layer at an interface with the transparent conductive layer side, and

wherein said p-type nitride semiconductor layer includes a current blocking region formed in contact with said transparent conductive layer.

21. The nitride semiconductor light-emitting device according to claim 20 , wherein

said reflecting layer has a through-port passing through said reflecting layer in a thickness direction in a region located immediately under said transparent conductive layer, and

said through-port provided in said reflecting layer is positioned immediately under said current blocking region.

22. A nitride semiconductor light-emitting device comprising:

a growth substrate, an n-type nitride semiconductor layer, a light emitting layer, a p-type nitride semiconductor layer, a transparent conductive layer, and a reflecting layer in this order,

wherein said reflecting layer includes a layer having a smaller critical angle of total reflection than said transparent conductive layer at an interface with the transparent conductive layer, and

wherein said layer having a smaller critical angle of total reflection than said transparent conductive layer has a through-port passing therethrough in a thickness direction in a region located immediately under said transparent conductive layer.

23. The nitride semiconductor light-emitting device according to claim 22 , wherein said growth substrate is a sapphire substrate having an irregularized surface.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 26, 2018
From: SHARP KABUSHIKI KAISHA
To: XIAMEN SAN'AN OPTOELECTRONICS CO., LTD.
Reel/Frame 047331/0728 →
Priority Claims (1)
JP 2008-201971 · Aug 5, 2008 · national
Continuity (2)
Continuation 12461184 · Aug 4, 2009
Related Publication 20120032144A1 · Feb 9, 2012