Protective layer for large-scale production of thin-film solar cells
View Patent ↗A solar cell includes a substrate, a protective layer located over a first surface of the substrate, a first electrode located over a second surface of the substrate, at least one p-type semiconductor absorber layer located over the first electrode, an n-type semiconductor layer located over the p-type semiconductor absorber layer, and a second electrode over the n-type semiconductor layer. The p-type semiconductor absorber layer includes a copper indium selenide (CIS) based alloy material, and the second electrode is transparent and electrically conductive. The protective layer has an emissivity greater than 0.25 at a wavelength of 2 μm, has a reactivity with a selenium-containing gas lower than that of the substrate, and may differ from the first electrode in at least one of composition, thickness, density, emissivity, conductivity or stress state. The emissivity profile of the protective layer may be uniform or non-uniform.
1. A method of manufacturing a solar cell, comprising:
providing a substrate;
depositing a protective layer over a first surface of the substrate;
depositing a first electrode over a second surface of the substrate;
depositing at least one p-type semiconductor absorber layer over the first electrode, wherein the p-type semiconductor absorber layer includes a copper indium selenide (CIS) based alloy material;
depositing an n-type semiconductor layer over the p-type semiconductor absorber layer to form a p-n junction; and
depositing a second electrode over the n-type semiconductor layer; wherein:
the protective layer has an emissivity that remains substantially constant during the step of depositing the at least one p-type semiconductor absorber layer.
2. The method of claim 1 , wherein the protective layer comprises at least one carbon based material having an emissivity greater than 0.25.
3. The method of claim 1 , wherein:
the protective layer comprises at least one transition metal layer intentionally alloyed with at least one of oxygen or nitrogen; and
the protective layer has an emissivity greater than 0.25.
4. The method of claim 1 , wherein the protective layer comprises an oxygen-containing molybdenum layer containing greater than 10 atomic % oxygen.
5. The method of claim 1 , wherein the emissivity of the protective layer is tuned to provide at least one of a predetermined substrate temperature or reduction of deposition cost.
6. The method of claim 1 , wherein the emissivity of the protective layer is tuned to provide a uniform substrate temperature.
7. The method of claim 1 , wherein a profile of the emissivity of the protective layer is configured to compensate for a non-uniformity of heat provided by at least one of one or more radiation heaters or edge effects.
8. The method of claim 1 , wherein the protective layer has a higher oxygen concentration at edges of the protective layer than in middle.
9. The method of claim 1 , wherein the emissivity of the protective layer has a uniform profile across a width of the protective layer.