IP Library Granted Patent US 8,441,024
Granted Patent B2
US 8,441,024 · App. 13/453,804 · Granted May 14, 2013

Semiconductor light emitting device and method for manufacturing the same

Inventors: Tae Yun Kim (Gwangju, KR); Hyo Kun Son (Gwangju, KR)
Assignee: LG Innotek Co., Ltd.
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Quick Facts
Patent No.
US 8,441,024
App. No.
13/453,804
Granted
May 14, 2013
Kind
B2
Abstract

A semiconductor light emitting device includes an active layer; a first nitride semiconductor layer on the active layer; a first delta-doped layer on the first nitride semiconductor layer; a second nitride semiconductor layer on the first delta-doped layer; a second delta-doped layer on the second nitride semiconductor layer; a third nitride semiconductor layer on the second delta-doped layer. The first delta-doped layer, the second nitride semiconductor layer, the second delta-doped layer, and the third nitride semiconductor layer are doped with an n-type dopant.

Claims (39)

1. A light emitting device comprising:

an active layer;

a first nitride semiconductor layer on the active layer;

a first delta-doped layer on the first nitride semiconductor layer;

a second nitride semiconductor layer on the first delta-doped layer;

a second delta-doped layer on the second nitride semiconductor layer;

a third nitride semiconductor layer on the second delta-doped layer,

wherein the first delta-doped layer, the second nitride semiconductor layer, the second delta-doped layer, and the third nitride semiconductor layer are doped with an n-type dopant.

2. The light emitting device according to claim 1 , further comprising a semiconductor layer including a semiconductor material having a composition formula of In x Al y Ga 1-x-y N (0≦x≦1, 0≦y≦1, 0≦x+y≦1) under the active layer.

3. The light emitting device according to claim 1 , wherein the third nitride semiconductor layer is formed of a semiconductor material having a composition formula of In x Al y Ga 1-x-y N (0≦x≦1, 0≦y≦1, 0≦x+y≦1).

4. The light emitting device according to claim 1 , wherein the first nitride semiconductor layer is an undoped semiconductor layer.

5. The light emitting device according to claim 1 , wherein the first nitride semiconductor layer includes GaN layer.

6. The light emitting device according to claim 1 , wherein the n-type dopant includes at least one of Si, Ge, or Sn.

7. The light emitting device according to claim 1 , wherein the active layer includes InGaN layer and GaN layer.

8. A light emitting device comprising:

an active layer;

a first nitride semiconductor layer on the active layer;

a first delta-doped layer on the first nitride semiconductor layer, the first delta-doped layer including a first n-type dopant;

a second nitride semiconductor layer on the first delta-doped layer, the second nitride semiconductor layer including a second n-type dopant;

a second delta-doped layer on the second nitride semiconductor layer, the second delta-doped layer including a third n-type dopant; and

a third nitride semiconductor layer on the second delta-doped layer.

9. The light emitting device according to claim 8 , further comprising a semiconductor layer including a semiconductor material having a composition formula of In x Al y Ga 1-x-y N (0≦x≦1, 0≦y≦1, 0≦x+y≦1) under the active layer.

10. The light emitting device according to claim 8 , wherein the third nitride semiconductor layer is formed of a semiconductor material having a composition formula of In x Al y Ga 1-x-y N (0≦x≦1, 0≦y≦1, 0≦x+y≦1).

11. The light emitting device according to claim 8 , wherein the first nitride semiconductor layer is an undoped semiconductor layer.

12. The light emitting device according to claim 8 , wherein the first nitride semiconductor layer includes a GaN layer.

13. The light emitting device according to claim 8 , wherein at least one of the first n-type dopant, the second n-type dopant, and the third n-type dopant includes at least one of Si, Ge, or Sn.

14. The light emitting device according to claim 8 , wherein the active layer includes an InGaN layer and a GaN layer.

15. A light emitting device comprising:

an active layer;

a first nitride semiconductor layer on the active layer;

a first delta-doped layer on the first nitride semiconductor layer, the first delta-doped layer including a first p-type dopant;

a second nitride semiconductor layer on the first delta-doped layer, the second nitride semiconductor layer including a second p-type dopant;

a second delta-doped layer on the second nitride semiconductor layer, the second delta-doped layer including a third p-type dopant; and

a third nitride semiconductor layer on the second delta-doped layer.

16. The light emitting device according to claim 15 , further comprising a semiconductor layer including a semiconductor material having a composition formula of In x Al y Ga 1-x-y N (0≦x≦1, 0≦y≦1, 0≦x+y≦1) under the active layer.

17. The light emitting device according to claim 15 , wherein the third nitride semiconductor layer is formed of a semiconductor material having a composition formula of In x Al y Ga 1-x-y N (0≦x≦1, 0≦y≦1, 0≦x+y≦1).

18. The light emitting device according to claim 15 , wherein the first nitride semiconductor layer is an undoped semiconductor layer.

19. The light emitting device according to claim 15 , wherein the first nitride semiconductor layer includes a GaN layer.

20. The light emitting device according to claim 15 , wherein the active layer includes an InGaN layer and a GaN layer.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 4, 2024
From: SUZHOU LEKIN SEMICONDUCTOR CO., LTD.
To: FAIRLIGHT INNOVATIONS, LLC
Reel/Frame 068839/0745 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 25, 2021
From: LG INNOTEK CO., LTD.
To: SUZHOU LEKIN SEMICONDUCTOR CO., LTD.
Reel/Frame 056366/0335 →
Priority Claims (1)
KR 10-2007-0086711 · Aug 28, 2007 · national
Continuity (4)
Continuation 13004758 · Jan 11, 2011
Continuation 12659208 · Mar 1, 2010
Continuation 12198728 · Aug 26, 2008
Related Publication 20120205664A1 · Aug 16, 2012