IP Library Granted Patent US 8,546,807
Granted Patent B2
US 8,546,807 · App. 12/990,198 · Granted Oct 1, 2013

Off-set top pixel electrode configuration

Inventors: Tim Von Werne (London, GB); Kieran Reynolds (Histon, GB); Boon Hean Pui (Cambridge, GB)
Assignee: Plastic Logic Limited
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Quick Facts
Patent No.
US 8,546,807
App. No.
12/990,198
Granted
Oct 1, 2013
Kind
B2
Abstract

A semiconductor device architecture where the top pixel electrode is deposited in an off-set configuration, such as to overlap the COM electrode, and also the gate electrode of the neighboring device.

Claims (28)

1. A multilayer electronic structure comprising: a substrate bearing at least three conducting layers, adjacent ones of said conducting layers being separated by a dielectric layer, a first one of said conducting layers defining drain and source electrodes of a thin film transistor (TFT) for driving a pixel of an active matrix optoelectronics device, an intermediate second one of said conducting layers defining a gate electrode of said transistor and a first plate of a capacitor for storing charge to maintain an electrical state of said active matrix pixel, and a third one of said conducting layers defining a pixel electrode as a second plate of said capacitor, wherein said pixel electrode is laterally positioned such that it is offset in a vertical direction from said gate electrode and such that it overlaps in a vertical direction with said first plate and at least a gate electrode of a thin film transistor for driving a neighbouring pixel of the active matrix optoelectronics device.

2. An electronic structure as claimed in claim 1 further comprising a via between said second plate and a drain pad coupled to said drain, said via being connected substantially centrally to a surface of said drain pad.

3. An electronic structure as claimed in claim 2 wherein said via is laterally positioned so as to pass through said first plate in a vertical direction.

4. A multilayer electronic structure as claimed in claim 1 wherein a plurality of dielectric layers is provided between said first and second conducting layers.

5. A multilayer electronic structure as claimed in claim 4 wherein a nearer one of the plurality of dielectric layers to an active region of said thin film transistor for driving a pixel has a lower dielectric constant than a farther one of the plurality of dielectric layers.

6. An electronic structure as claimed in claim 1 wherein said thin film transistor comprises an organic semiconductor material.

7. An electronic structure as claimed in claim 6 wherein the electronic structure is adapted to solution deposition.

8. An electronic structure as claimed in claim 1 wherein said substrate comprises a flexible substrate.

9. A pixel drive structure for an active matrix display including the multilayer electronic structure of claim 1 wherein said second plate of said capacitor comprises a pixel drive electrode for driving a pixel of said display.

10. A pixel drive structure as claimed in claim 9 wherein said first plate of said capacitor is connected to a reference potential line or interconnect of said pixel drive structure.

11. An active matrix display comprising a plurality of lines of pixel drive structures as claimed in claim 9 , and a plurality of source lines disposed substantially parallel and alternating to said lines of pixel drive structures, wherein said neighbouring pixel is a neighbour in a same one of said lines of pixel drive structures.

12. An active matrix display as claimed in claim 9 wherein second plates of each line of pixel drive structures are positioned such that they planarly overlap with a corresponding adjacent one of the source lines.

13. A method of fabricating a multilayer electronic structure on a substrate, the method comprising:

depositing and patterning a first conducting layer over said substrate to define source and drain electrodes of a thin film transistor for driving a pixel of an active matrix optoelectronics device;

depositing an organic semiconducting layer over said first conducting layer;

depositing a first dielectric layer over said organic semiconducting layer;

depositing and patterning a first portion of a second conducting layer over said first dielectric layer to define a gate electrode of said thin film transistor;

depositing and patterning a second portion of said second conducting layer substantially coplanar to said first portion to define a first plate of a capacitor for storing charge to maintain an electrical state of said active matrix pixel;

depositing a second dielectric layer over said second conducting layer;

depositing and patterning a third conducting layer over said second dielectric layer to define a second plate of said capacitor;

wherein said second plate is laterally positioned such that it is offset in a vertical direction from said gate electrode and such that it overlaps in a vertical direction with said first plate and at least a gate electrode of a thin film transistor for driving a neighbouring pixel of the active matrix optoelectronics device.

14. A method of fabricating a multilayer electronic structure as claimed in claim 13 wherein said depositing and patterning a first conducting layer over said substrate further defines a drain pad coupled to said drain.

15. A method of fabricating a multilayer electronic structure as claimed in claim 14 wherein, prior to depositing and patterning said third conducting layer, the method further comprises forming a via to said drain pad, and wherein said via is formed such that it connects substantially centrally to an upper surface of said drain pad.

16. A method of fabricating a multilayer electronic structure as claimed in claim 13 wherein a plurality of dielectric layers is deposited between said organic semiconducting layer and second conducting layer.

17. A method of fabricating a multilayer electronic structure as claimed in claim 13 wherein a plurality of dielectric layers is deposited between said second and third conducting layers.

18. A method of fabricating a multilayer electronic structure as claimed in claim 16 wherein relative to said organic semiconducting layer, a nearer one of the plurality of dielectric layers has a lower dielectric constant than a farther one of the plurality of dielectric layers.

19. A method of fabricating a multilayer electronic structure as claimed in claim 13 wherein at least some of said deposition and patterning steps employ a solution processing technique.

20. A method of fabricating an active matrix display comprising fabricating a structure for substantially each of a plurality of pixels of said display as claimed in the method of claim 13 .

Assignments (2)
CHANGE OF NAME Recorded Jul 23, 2015
From: PLASTIC LOGIC LIMITED
To: FLEXENABLE LIMITED
Reel/Frame 036176/0105 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 28, 2010
From: VON WERNE, TIM; PUI, BOON HEAN; REYNOLDS, KIERAN
To: PLASTIC LOGIC LIMITED
Reel/Frame 025216/0135 →
Priority Claims (2)
GB 0807767.9 · Apr 28, 2008 · national
GB 0901970.4 · Feb 9, 2009 · national
Continuity (1)
Related Publication 20110101361A1 · May 5, 2011