IP Library Granted Patent US 8,677,607
Granted Patent B2
US 8,677,607 · App. 12/044,427 · Granted Mar 25, 2014

Method of manufacturing magnetoresistive element

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Quick Facts
Patent No.
US 8,677,607
App. No.
12/044,427
Granted
Mar 25, 2014
Kind
B2
Abstract

The method according to the present invention includes the steps of: sequentially applying a plurality of different voltages to an MR element and sequentially detecting output signals from the MR element; and eliminating the MR element as a defective product when an evaluation value, based on a difference of SN ratios of the output signals from the MR element respectively obtained for each applied voltage, is less than a threshold value, and selecting the MR element as a non-defective product when the evaluation value is greater than or equal to the threshold value.

Claims (18)

1. A method of manufacturing a magnetic device, comprising the steps of:

(a) sequentially applying a plurality of different voltages to a magnetoresistive (MR) element and sequentially detecting output signals from the MR element, the output signals being respectively obtained for each applied voltage; and

(b) eliminating the MR element as a defective product when at least one evaluation value based on a difference of signal-to-noise (SN) ratios of the output signals is less than a first threshold value, and selecting the MR element as a non-defective product when the at least one evaluation value is greater than or equal to the first threshold value.

2. The method of manufacturing a magnetic device according to claim 1 , wherein the at least one evaluation value is a difference of the SN ratios.

3. The method of manufacturing a magnetic device according to claim 1 , further comprising a step of eliminating the MR element as a defective product when the number of evaluation values is plural and an evaluation value different from the at least one evaluation value of the step (b) is less than a second threshold value, even if the at least one evaluation value of the step (b) is greater than or equal to the first threshold value.

4. The method of manufacturing a magnetic device according to claim 1 , further comprising a step of attaching the MR element selected as the non-defective product in the step (b) to a head gimbal assembly.

5. The method of manufacturing a magnetic device according to claim 1 , further comprising

a step of attaching the MR element to a head gimbal assembly,

wherein the step (a) is performed after the MR element is attached to the head gimbal assembly.

6. A method of manufacturing a magnetic device, comprising the steps of:

(a) sequentially applying a plurality of different voltages to a magnetoresistive (MR) element and sequentially detecting output signals from the MR element;

(b) obtaining a first signal-to-noise (SN) ratio of the output signals for a first voltage of the plurality of different voltages and obtaining a second SN ratio of the output signals for a second voltage of the plurality of different voltages;

(c) calculating a difference between the first and the second SN ratios and basing an evaluation value of the MR element on the calculated difference; and

(d) eliminating the MR element as a defective product when the evaluation value is less than a first threshold value, and selecting the MR element as a non-defective product when the evaluation value is greater than or equal to the first threshold value.

7. The method of manufacturing a magnetic device according to claim 6 , further comprising the steps of:

(e) obtaining a third SN ratio of the output signals for a third voltage of the plurality of different voltages;

(f) calculating a difference between the second and the third SN ratios and basing an other evaluation value of the MR element on the calculated difference; and

(g) eliminating the MR element as a defective product when the other evaluation value is less than a second threshold value, even if the evaluation value of the step (c) is greater than or equal to the first threshold value.

Assignments (2)
CHANGE OF ADDRESS Recorded Jun 12, 2013
From: TDK CORPORATION
To: TDK CORPORATION
Reel/Frame 030651/0687 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 16, 2008
From: YANAGISAWA, TAKUMI; HIROSE, MASARU; SARUKI, SHUNJI
To: TDK CORPORATION
Reel/Frame 020994/0070 →