IP Library Granted Patent US 8,733,149
Granted Patent B2
US 8,733,149 · App. 13/513,283 · Granted May 27, 2014

Film bulk acoustic wave resonator-based ethanol and acetone sensors and methods using the same

Inventors: Hongyu Yu (Tempe, AZ); Xiaotun Qiu (Tempe, AZ)
Assignee: Arizona Board of Regents, a body corporate of the State of Arizona, Acting for and on Behalf of Arizona State University
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Quick Facts
Patent No.
US 8,733,149
App. No.
13/513,283
Granted
May 27, 2014
Kind
B2
Abstract

The present invention relates generally to the detection of alcohol. The present invention relates more particularly to the film bulk acoustic wave resonator-based devices, and their use in the sensing of ethanol and/or acetone. One aspect of the invention is a method for detecting ethanol, acetone or both in a gaseous sample including: providing a film bulk acoustic wave resonator having a zinc oxide piezoelectric layer; exposing the film bulk acoustic wave resonator to the gaseous sample; determining the resonant frequency of the film bulk acoustic wave resonator; and determining the concentration of ethanol, the concentration of acetone, or both in the gaseous sample using the resonant frequency of the film bulk acoustic wave resonator.

Claims (46)

1. A method for detecting ethanol and acetone in a gaseous sample, the method comprising

providing a film bulk acoustic wave resonator having a zinc oxide piezoelectric layer;

exposing the film bulk acoustic wave resonator to the gaseous sample;

determining the resonant frequency of the film bulk acoustic wave resonator; and

determining the concentration of ethanol and acetone in the gaseous sample using the resonant frequency of the film bulk acoustic wave resonator, wherein the resonant frequency of the film bulk acoustic-wave resonator increases with exposure to acetone vapor and decreases with exposure to ethanol vapor.

2. The method according to claim 1 , wherein the film bulk acoustic wave resonator comprises:

a first electrode layer;

the zinc oxide piezoelectric layer disposed on the first electrode;

a second electrode layer disposed on the zinc oxide piezoelectric layer; and

a resonant frequency measuring circuit operatively coupled to the first electrode and the second electrode.

3. The method according to claim 2 , wherein

the zinc oxide piezoelectric layer has a thickness in the range of 0.2 μm to 5.0 μm;

the first electrode layer has a thickness in the range of 0.1 μm to 1.0 μm; and

the second electrode layer has a thickness in the range of 0.1 μm to 1.0 μm.

4. The method according to claim 2 , further comprising a diaphragm layer having a thickness in the range of 0.1 μm to 2 μm, upon which the first electrode layer is disposed.

5. The method according to claim 4 , wherein

the diaphragm layer has a thickness up to 2.0 μm;

the zinc oxide piezoelectric layer has a thickness in the range of 0.2 μm to 5.0 μm;

the first electrode layer has a thickness in the range of 0.1 μm to 1.0 μm; and

the second electrode layer has a thickness in the range of 0.1 μm to 1.0 μm.

6. The method according to claim 2 , wherein the zinc oxide piezoelectric layer has a surface area in the range of 0.0025 mm 2 to 0.2 mm 2 .

7. The method according to claim 1 , wherein the film bulk acoustic wave resonator comprises:

a diaphragm layer suspended above a void space, the diaphragm layer having a first side and a second side;

a zinc oxide piezoelectric layer disposed on the first side of the diaphragm layer;

a first electrode layer disposed on the zinc oxide piezoelectric layer;

a second electrode layer disposed on the second side of the diaphragm layer; and

a resonant frequency measuring circuit operatively coupled to the first electrode layer and the second electrode layer.

8. The method according to claim 1 , wherein the zinc oxide layer is substantially crystalline, with its wurtzite C axis is substantially perpendicular to its opposed surfaces.

9. The method according to claim 1 , wherein the film bulk acoustic wave resonator has a resonant frequency in the range of 0.2 GHz to 10 GHz.

10. The method according to claim 1 , wherein the film bulk acoustic wave resonator is configured to change its resonant frequency substantially linearly with ethanol concentration throughout the range of about 100 ppm to about 250 ppm.

11. The method according to claim 1 , wherein the gaseous sample is the breath of a human subject.

12. The method of claim 1 , wherein the resonant frequency of the film bulk acoustic wave resonator is determined both with and without ultraviolet irradiation.

13. A breath alcohol analyzer comprising a film bulk acoustic wave resonator having a zinc oxide piezoelectric layer; and a resonant frequency measuring circuit adapted to determine an ethanol concentration and an acetone concentration of a gaseous sample using a resonant frequency measured by the resonant frequency measuring circuit, wherein the resonant frequency of the film bulk acoustic-wave resonator increases with exposure to acetone vapor and decreases with exposure to ethanol vapor.

14. The analyzer according to claim 13 , wherein the film bulk acoustic wave resonator comprises:

a first electrode layer;

the zinc oxide piezoelectric layer disposed on the first electrode;

a second electrode layer disposed on the zinc oxide piezoelectric layer; and

the resonant frequency measuring circuit operatively coupled to the first electrode layer and the second electrode layer.

15. The analyzer according to claim 14 , wherein

the zinc oxide piezoelectric layer has a thickness in the range of 0.2 μm to 5.0 μm;

the first electrode layer has a thickness in the range of 0.1 μm to 1.0 μm; and

the second electrode layer has a thickness in the range of 0.1 μm to 1.0 μm.

16. The analyzer according to claim 14 , further comprising a diaphragm layer having a thickness up to 2 μm, upon which the first electrode layer is disposed.

17. The analyzer according to claim 14 , wherein the zinc oxide piezoelectric layer has a surface area in the range of 0.0025 mm 2 to 0.2 mm 2 .

18. The analyzer according to claim 13 , wherein the zinc oxide layer is substantially crystalline, with its wurtzite C axis is substantially perpendicular to its opposed surfaces.

19. The analyzer according to claims 13 , wherein the resonant frequency measuring circuit is operatively coupled to a system for determining a concentration of ethanol and acetone in a gaseous sample.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 8, 2014
From: YU, HONGYU; QIU, XIAOTUN
To: ARIZONA BOARD OF REGENTS, A BODY CORPORATE OF THE STATE OF ARIZONA ACTING FOR AND ON BEHALF OF ARIZONA STATE UNIVERSITY
Reel/Frame 032630/0964 →
Continuity (2)
Provisional Application 61296696 · Jan 20, 2010
Related Publication 20120297859A1 · Nov 29, 2012