Device for measuring the angle of rotation of two objects rotating in relation to each other
Device for measuring the rotating angle of two objects rotating in relation to each other, with a transmitter which is assigned to one of the objects and which emits light that is either polarized or becomes polarized by means of a polarization filter, and with a polarization-sensitive analyzer such that the transmitter and the analyzer rotate relative to each other as dependent on the rotating angle, and with a receiver which measures the intensity of light passing through the analyzer in order to create a signal that is dependent on the rotating angle, where a magnetized element is positioned on one of the objects and a sensor for detecting a magnetic field is positioned on the other object.
1. Device for measuring the rotating angle of two objects rotating in relation to each other comprising
a transmitter which is assigned to one of the objects and which emits light that is either polarized or becomes polarized by means of a polarization filter,
a polarization-sensitive analyzer such that the transmitter and the analyzer rotate relative to each other as dependent on the rotating angle, and
a receiver which measures the intensity of light passing through the analyzer in order to create a signal that is dependent on the rotating angle,
wherein a magnetized element is positioned on one of the objects and a sensor for detecting a magnetic field is positioned on the other object such that on evaluation of the magnetic field detected by the sensor and the light intensity detected by the receiver, a measurement of the angle of rotation is made possible for an entire rotation.
2. Device according to claim 1 , wherein the magnetized element is positioned on the rotating object.
3. Device according to claim 1 , wherein the magnetized element is magnetized in radial fashion.
4. Device according to claim 1 , wherein the sensor is designed as a Hall sensor.
5. Device according to claim 1 , wherein the magnetized element is designed as a support surface for the analyzer.
6. Device according to claim 1 , wherein the analyzer is designed as a polarization film.
7. Device according to claim 1 , wherein the receiver and the sensor for detecting a magnetic field are constructed on a semiconductor element and, in particular, are integrated on a CMOS-ASIC.