IP Library Granted Patent US 8,941,393
Granted Patent B2
US 8,941,393 · App. 13/218,090 · Granted Jan 27, 2015

Detection of a conductive object during an initialization process of a touch-sensing device

Inventor: Kristopher L. Young (Atlanta, GA)
Assignee: Cypress Semiconductor Corporation
G01R27/2605G06F3/0418
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Quick Facts
Patent No.
US 8,941,393
App. No.
13/218,090
Granted
Jan 27, 2015
Kind
B2
Abstract

A method and system for detecting a presence of a conductive object proximate to a capacitive sense element during an initialization process of a touch-sensing device. A reference sense element is calibrated to produce a sensing parameter value. A capacitance of a plurality of capacitive sense elements is measured based on the sensing parameter value, and compared to a baseline capacitance value stored in a non-volatile memory of the touch-sensing device. The presence of a conductive object proximate to a capacitive sense element is detected when a difference between the measured capacitance and the stored baseline capacitance value is greater than a threshold value.

Claims (36)

1. A method, comprising:

during an initialization process of a touch-sensing device:

measuring a capacitance of a reference sense element disposed on a second side of a printed circuit board of the touch-sensing device, wherein the measured capacitance is responsive to an environmental condition and is not responsive to a conductive object,

comparing the measured capacitance of the reference sense element to a target measurement output value, and

calibrating a capacitance measurement of the reference sense element to produce a sensing parameter value;

comparing a capacitance measured on each of a plurality of capacitive sense elements disposed on a first side of the printed circuit board based on the sensing parameter value to a baseline capacitance value for each of the plurality of capacitive sense elements to determine a capacitance difference value; and

detecting a presence of the conductive object proximate to a capacitive sense element when the capacitance difference value for the capacitive sense element is greater than a threshold value.

2. The method of claim 1 , wherein calibrating the capacitance measurement of the reference sense element further comprises adjusting a sensing parameter to the sensing parameter value to set the measured capacitance of the reference sense element to the target measurement output value.

3. The method of claim 2 , wherein the sensing parameter is a current of a current source connected to a capacitance sensor of the touch-sensing device.

4. The method of claim 2 , wherein the sensing parameter is a voltage of a voltage source connected to a capacitance sensor of the touch-sensing device.

5. The method of claim 2 , wherein the sensing parameter is programmable by a processing device.

6. The method of claim 1 , wherein the presence of the conductive object proximate to the capacitive sense element is detected during the initialization process of the touch-sensing device.

7. The method of claim 1 , wherein the baseline capacitance value for each of the plurality of capacitive sense elements is stored in a non-volatile memory.

8. A system, comprising:

a processing device coupled to a capacitance sensor, the capacitance sensor comprising:

a printed circuit board comprising a first side including a plurality of capacitive sense elements disposed thereon, and a second side including a reference sense element disposed thereon, and

a sensing parameter,

wherein the processing device is to:

measure a capacitance of the reference sense element, wherein the measured capacitance is responsive to an environmental condition and is not responsive to a presence of a conductive object,

compare the measured capacitance of the reference sense element to a target measurement output value,

adjust the sensing parameter to a sensing parameter value to set a measured capacitance of the reference sense element to the target measurement output value,

compare a capacitance of each of the plurality of capacitive sense elements to a baseline capacitance value for each of the plurality of capacitive sense elements to determine a capacitance difference value, and

detect a presence of the conductive object proximate to a capacitive sense element when the capacitance difference value for the capacitive sense element is greater than a threshold value.

9. The system of claim 8 , wherein the capacitance sensor is to measure the capacitance of each of the plurality of capacitive sense elements based on the sensing parameter value.

10. The system of claim 8 , wherein the baseline capacitance value for each of the plurality of capacitive sense elements is stored in a non-volatile memory of the touch-sensing device.

11. The system of claim 8 , wherein the presence of the conductive object proximate to the capacitive sense element is detected during an initialization process of the touch-sensing device.

12. The system of claim 8 , wherein the reference sense element is not responsive to the presence of the conductive object during an initialization process of the touch-sensing device.

13. The system of claim 8 , wherein the sensing parameter is a programmable current.

14. The system of claim 8 , further comprising a printed circuit board comprising an overlay covering the reference sense element such that the reference sense element is not responsive to a presence of a conductive object proximate to the reference sense element during an initialization process of the touch-sensing device.

15. A non-transitory computer-readable medium including data that, when accessed by a processing device, causes the processing device to perform operations comprising:

during an initialization process power up of a touch-sensing device, measuring a capacitance of a reference sense element disposed on a second side of a printed circuit board of the touch-sensing device, wherein the measured capacitance is responsive to an environmental condition and is not responsive to a presence of a conductive object, comparing the measured capacitance of the reference sense element to a target measurement output value, and calibrating a measurement of a reference sense element to produce a sensing parameter value;

comparing a capacitance measured on each of a plurality of capacitive sense elements disposed on a first side of the printed circuit board based on the sensing parameter value to a baseline capacitance value stored in a non-volatile memory for each of the plurality of capacitive sense elements to determine a capacitance difference value; and

detecting a presence of the conductive object proximate to a capacitive sense element during the initialization process power up of the touch-sensing device when the capacitance difference value for the capacitive sense element is greater than a touch threshold value.

16. The non-transitory computer-readable medium of claim 15 , wherein the operations further comprise adjusting a sensing parameter to a sensing parameter value to set a capacitance of the reference sense element to a target measurement output value.

17. The non-transitory computer-readable medium of claim 16 , wherein the sensing parameter is a current of a current source connected to a capacitance sensor of the touch-sensing device.

18. The non-transitory computer-readable medium of claim 15 , wherein the capacitance on the capacitive sense element is measured by a capacitance sensor.

Assignments (6)
CORRECTIVE ASSIGNMENT TO CORRECT THE 8647899 PREVIOUSLY RECORDED ON REEL 035240 FRAME 0429. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTERST. Recorded Nov 3, 2020
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 058002/0470 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 14, 2016
From: CYPRESS SEMICONDUCTOR CORPORATION
To: MONTEREY RESEARCH, LLC
Reel/Frame 040911/0238 →
PARTIAL RELEASE OF SECURITY INTEREST IN PATENTS Recorded Aug 11, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
Reel/Frame 039708/0001 →
SECURITY INTEREST Recorded Mar 21, 2015
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 035240/0429 →
PATENT SECURITY AGREEMENT Recorded Aug 28, 2012
From: CYPRESS SEMICONDUCTOR CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 028863/0870 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 26, 2011
From: YOUNG, KRISTOPHER L.
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 026814/0026 →
Continuity (2)
Provisional Application 61433148 · Jan 14, 2011
Related Publication 20120212240A1 · Aug 23, 2012