Method for protection of a layer of a vertical stack and corresponding device
View Patent ↗A device and corresponding fabrication method includes a vertical stack having an intermediate layer between a lower region and an upper region. The intermediate layer is extended by a protection layer. The vertical stack has a free lateral face on which the lower region, the upper region and the protection layer are exposed.
1. A device comprising:
a vertical stack comprising a first silicon substrate, a second silicon substrate, and at least one intermediate layer between said first silicon substrate and second silicon substrate;
said vertical stack comprising at least one free lateral face on which said first and second silicon substrates are exposed; and
said vertical stack comprising a protection material in a cavity adjacent said at least one intermediate layer, with said protection material extending to the at least one free lateral face for exposure, and at least one of said first and second silicon substrates having a beveled edge, and with the at least one free lateral face being on a periphery of at least one of said first and second silicon substrates.
2. The device according to claim 1 , wherein said at least one intermediate layer comprises a plurality of intermediate layers between said first and second silicon substrates, said vertical stack further comprising at least one separating region separating said plurality of intermediate layers, with said at least one separating region extended to the at least one free lateral face, and with there being protection material in a respective cavity adjacent each intermediate layer so that each intermediate layer is also extended to the at least one free lateral face.
3. The device according to claim 1 , further comprising a substrate, and wherein said vertical stack is on said substrate.
4. The device according to claim 3 , wherein an integrated circuit is fabricated on said substrate, and wherein said vertical stack further includes at least one trench within said integrated circuit so that the at least one free lateral face comprises two free lateral faces.
5. The device according claim 1 , wherein said at least one intermediate layer comprises copper and said protection material comprises a dielectric material.
6. The device according to claim 1 , wherein said at least one intermediate layer has a thickness, and said protection material has a thickness that is greater than or equal to one-half the thickness of said at least one intermediate layer.
7. A device comprising: a vertical stack comprising
a first silicon substrate,
a second silicon substrate,
a plurality of intermediate layers between said first and second silicon substrates,
at least one separating region separating said plurality of intermediate layers,
said first and second silicon substrates and said at least one separating region extending to at least one free lateral face for exposure, and
protection material adjacent each intermediate layer and in a cavity so that each protection material is also extended to the at least one free lateral face for exposure, and at least one of said first and second silicon substrates having a beveled edge, and with the at least one free lateral face being on a periphery of at least one of said first and second silicon substrates.
8. The device according to claim 7 , further comprising a substrate, and wherein said vertical stack is on said substrate.
9. The device according to claim 8 , wherein an integrated circuit is fabricated on said substrate, and wherein said vertical stack further includes at least one trench within said integrated circuit so that the at least one free lateral face comprises two free lateral faces.
10. The device according claim 7 , wherein each intermediate layer comprises copper and said protection material comprises a dielectric material.