High density magnetic memory based on nanotubes
A novel magnetic memory cell utilizing nanotubes as conducting leads. The magnetic memory cell may be built based on MTJ (Magnetic Tunnel Junction) or GMR (Giant Magneto Resistance) sensors or devices of similar nature. A SET (Single Electron Transistor) made of semiconducting nanotubes may be used as access devices and/or to build peripheral circuitry.
1. A memory device, comprising:
an array of magnetic random access memory cells arranged in a grid, wherein each magnetic random access memory cell comprises:
a word line;
a bit line;
a magnetic storage element disposed between the word line and the bit line; and
an access transistor located below the bit line and electrically connected thereto, wherein the access transistor is defined by a semiconducting nanotube patterned with a gate oxide and a gate material to form a gate therein, wherein a portion of the semiconducting nanotube on one side of the gate forms a drain, and a portion of said semiconducting nanotube on the other side of the gate defines a source;
wherein the access transistors of at least two neighboring magnetic random access memory cells of the array are formed from a common semiconducting nanotube.
2. The memory device of claim 1 , wherein the semiconducting nanotubes comprise carbon nanotubes.
3. The memory device of claim 1 , wherein the magnetic storage element comprises a Magnetic Tunnel Junction (MTJ).
4. The memory device of claim 1 , wherein the word line is a single nanotube.
5. The memory device of claim 1 , further comprising a common source line connecting at least some of the sources to ground.
6. The memory device of claim 1 , wherein the bit line of each magnetic random access memory cell is a single nanotube.
7. The memory device of claim 1 , wherein the word line of each magnetic random access memory cell is a single, multi-walled nanotube.
8. The memory device of claim 1 , wherein the bit line of each magnetic random access memory cell is a single, multi-walled nanotube.
9. A memory device, comprising:
a first read/write line;
a second read/write line;
a write line;
a first magnetic storage element disposed between the first read/write line and the write line;
a second magnetic storage element disposed between the second read/write line and the write line; and
an access transistor nanotube forming:
a first access transistor located below the first read/write line and electrically connected to the first read/write line via a first magnetic stack of the first magnetic storage element; and
a second access transistor located below the second read/write line and electrically connected to the second read/write line via a second magnetic stack of the second magnetic storage element.
10. The memory device of claim 9 , further comprising a bottom electrode that includes a nanotube that extends from the first magnetic storage element to a via that is electrically coupled to a drain of the first access transistor.
11. The memory device of claim 9 , wherein the write line is a single nanotube.
12. The memory device of claim 9 , wherein the first read/write line is a single nanotube.
13. The memory device of claim 9 , further comprising:
a first nanotube that electrically couples the first magnetic stack to the first read/write line; and
a second nanotube that electrically couples the second magnetic stack to the second read/write line.
14. The memory device of claim 13 , wherein the first nanotube is a carbon nanotube.
15. The memory device of claim 13 , wherein the first nanotube is a single-walled nanotube.
16. A memory device, comprising:
a plurality of read/write lines;
a write line;
an access transistor nanotube;
a plurality of magnetic random access memory cells, wherein each magnetic random access memory cell includes a magnetic storage element disposed between the write line and an associated read/write line of the plurality of read/write lines; and
an access transistor nanotube that is common to the plurality of magnetic random access memory cells;
wherein the common access transistor nanotube provides a separate access transistor for each magnetic random access memory cell of the plurality of random access memory cells.
17. The memory device of claim 16 , wherein each separate access transistor for each magnetic random access memory cell includes a gate oxide and a gate material patterned on the common access transistor nanotube, a drain formed from a portion of the access transistor nanotube on one side of the respective gate, and a source formed from a portion of the access transistor nanotube on the other side of the respective gate.
18. The memory device of claim 16 , wherein the write line is a single nanotube.
19. The memory device of claim 16 , wherein the magnetic storage element of each magnetic random access memory cell comprises a Magnetic Tunnel Junction (MTJ).
20. The memory device of claim 17 , wherein each magnetic random access memory cell further comprises:
a bottom electrode including a nanotube that extends from the respective magnetic storage element to a via that is electrically coupled to the drain of the respective access transistor.
21. The memory device of claim 20 , wherein the nanotube of the bottom electrode of each magnetic random access memory cell is a carbon nanotube.
22. The memory device of claim 20 , wherein the source of the respective access transistor is connected to ground via a source line.
23. The memory device of claim 1 , wherein the read/write line is a single nanotube.