Semiconductor component, reflected-light barrier and method for producing a housing therefor

1. A semiconductor component comprising:

a monolithic housing lower part wherein the housing lower part comprises:

a housing material;

a top side, and

at least a first and a second cavity, wherein the cavities are open toward the top side of the housing lower part;

at least one semiconductor chip which emits an electromagnetic radiation, wherein the emitting semiconductor chip is arranged in the first cavity;

at least one semiconductor chip which detects an electromagnetic radiation, wherein the detecting semiconductor chip is arranged in the second cavity; and

a third semiconductor chip which is completely encapsulated with the housing material, wherein the third semiconductor chip is an electrostatic discharge (ESD) chip or an application specific integrated circuit (ASIC) controlling the emitting of the electromagnetic radiation and the detecting of the electromagnetic radiation,

wherein the at least one semiconductor chip which emits the electromagnetic radiation, the at least one semiconductor chip which detects the electromagnetic radiation and the third semiconductor chip are arranged on a leadframe, the leadframe being non-transmissive to the electromagnetic radiation that is to be emitted and to be detected, the leadframe being electrically conductively contact-connectable via an underside of the semiconductor component lying opposite to the top side of the housing lower part, and

wherein the housing lower part is composed of a material that absorbs or reflects the emitted electromagnetic radiation.

2. The semiconductor component of claim 1 , wherein the housing lower part is produced by means of injection molding methods or transfer molding methods.

3. The semiconductor component of claim 1 , wherein the semiconductor component has a housing upper part, wherein the housing upper part is at least partly transparent to the radiation that is to be emitted and the radiation that is to be detected.

4. The semiconductor component of claim 3 , wherein the housing upper part is an optical element.

5. The semiconductor component of claim 4 , wherein the optical element is an individual lens or a lens array.

6. The semiconductor component of claim 1 , wherein a third cavity is provided, which comprises the third semiconductor chip.

7. A photo-reflective sensor comprising the semiconductor component of claim 1 .

8. A method for producing a semiconductor component, comprising the steps of:

providing a leadframe;

molding a first potting compound around the leadframe, in such a way that a monolithic housing lower part having at least a first and a second cavity arises, wherein the cavities are open toward a top side of the housing lower part;

positioning at least one semiconductor chip which emits an electromagnetic radiation on the leadframe within the first cavity;

positioning at least one semiconductor chip which detects an electromagnetic radiation on the leadframe within the second cavity;

electrically connecting the semiconductor chips to the leadframe; and

before the molding step, positioning a third semiconductor chip on the leadframe and electrically conductively connecting said third semiconductor chip to the leadframe, wherein the third semiconductor chip is an electrostatic discharge (ESD) chip or an application specific integrated circuit (ASIC) controlling the emitting of the electromagnetic radiation and the detecting of the electromagnetic radiation, and the first potting compound is molded completely around the third semiconductor chip in the molding step,

wherein the leadframe is non-transmissive to the electromagnetic radiation that is to be emitted and to be detected and the leadframe is electrically conductively contact-connectable via an underside of the semiconductor component lying opposite to the top side of the housing lower part.

9. The method of claim 8 , wherein the cavities are potted by means of a second potting material, which is transparent to the radiation that is to be emitted and to be detected.

10. The method of claim 9 , wherein the second potting material is additionally shaped as an optical element.

11. The method of claim 10 , wherein the optical element is produced by means of a compression molding method.

12. The method of claim 8 , wherein the first potting compound is an epoxy resin, a silicone comprising fillers or a mixture of epoxy resin and silicone comprising fillers.

13. A method for producing a semiconductor component, comprising the steps of:

providing at least one semiconductor chip which emits an electromagnetic radiation, at least one semiconductor chip which detects an electromagnetic radiation, and a leadframe which is non-transmissive to the electromagnetic radiation electromagnetic radiation that is to be emitted and to be detected;

providing a third semiconductor chip that is an electrostatic discharge (ESD) chip or an application specific integrated circuit (ASIC) controlling the emitting of the electromagnetic radiation and the detecting of the electromagnetic radiation;

positioning the third semiconductor chip on the leadframe and electrically conductively contact-connecting the third semiconductor chip to the leadframe;

molding a first potting compound around the leadframe in such a way that a monolithic housing lower part having at least a first and a second cavity arises, wherein the cavities are open toward a top side of the housing lower part, and in such a way that the first potting compound is molded completely around the third semiconductor chip in the molding step;

positioning the at least one semiconductor chip which emits an electromagnetic radiation on the leadframe within the first cavity;

positioning the at least one semiconductor chip which detects an electromagnetic radiation on the leadframe within the second cavity;

electrically connecting the at least two semiconductor chips to the leadframe;

filling a second potting material into the cavities, wherein the second potting material is transparent to the radiation that is to be emitted and to be detected,

shaping the second potting material as an optical and element,

wherein the production steps are performed in the indicated order.