IP Library Granted Patent US 9,607,907
Granted Patent B2
US 9,607,907 · App. 14/954,993 · Granted Mar 28, 2017

Electric-programmable magnetic module and picking-up and placement process for electronic devices

Inventors: Ming-Hsien Wu (Tainan, TW); Yen-Hsiang Fang (New Taipei, TW); Chia-Hsin Chao (Hsinchu County, TW)
Assignees: Industrial Technology Research Institute; PlayNitride Inc.
H01L22/20H01L24/75H01L24/81H01L33/0095
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Quick Facts
Patent No.
US 9,607,907
App. No.
14/954,993
Granted
Mar 28, 2017
Kind
B2
Abstract

A picking-up and placement process for electronic devices comprising: (a) providing a first substrate having a plurality of electronic devices formed thereon, the electronic devices being arranged in an array, and each of the electronic devices comprising a magnetic portion; (b) selectively picking-up parts of the electronic devices from the first substrate via a magnetic force generated from an electric-programmable magnetic module; and (c) bonding the parts of the electronic devices picked-up by the electric-programmable magnetic module with a second substrate.

Claims (72)

1. A picking-up and placement process for electronic devices, comprising:

(a) providing a first substrate having a plurality of electronic devices formed thereon, the electronic devices being arranged in an array, and each of the electronic devices comprising a magnetic portion;

(b) selectively picking-up parts of the electronic devices from the first substrate via a magnetic force generated from an electric-programmable magnetic module; and

(c) bonding the parts of the electronic devices picked-up by the electric-programmable magnetic module with a second substrate,

wherein a method for fabricating the first substrate having the electronic devices thereon comprises:

forming a photoelectric semiconductor layer on a growth substrate;

forming a plurality of electrodes on the photoelectric semiconductor layer;

bonding the photoelectric semiconductor layer with the first substrate through an adhesive, wherein the adhesive adheres with the electrodes and the photoelectric semiconductor layer and is between the photoelectric semiconductor layer and the first substrate;

removing the growth substrate to expose a surface of the photoelectric semiconductor layer;

forming a sacrificial layer on the surface of the photoelectric semiconductor layer;

forming the magnetic portions on the sacrificial layer;

patterning the photoelectric semiconductor layer, the adhesive and the sacrificial layer to form the electronic devices, a plurality of sacrificial patterns disposed on the electronic devices and a plurality of adhesion patterns disposed between the electronic devices and the first substrate;

forming a supporting layer on the first substrate, wherein the supporting layer is between and connects the electronic devices, and each of the adhesion patterns is exposed by the supporting layer; and

removing the adhesion patterns to form a gap between each of the electronic devices and the first substrate.

2. The picking-up and placement process for electronic devices according to claim 1 , further comprising:

repeating step (a) through step (c) at least one time to bond the electronic devices formed on different first substrates with the second substrate.

3. The picking-up and placement process for electronic devices according to claim 2 , wherein the electronic devices formed on different first substrates emit different colored lights.

4. The picking-up and placement process for electronic devices according to claim 1 , further comprising:

thinning the photoelectric semiconductor layer after the growth substrate is removed and before the sacrificial layer is formed.

5. The picking-up and placement process for electronic devices according to claim 1 , further comprising:

removing the sacrificial patterns on the electronic devices that are bonded with the second substrate.

6. The picking-up and placement process for electronic devices according to claim 1 , further comprising:

thinning the photoelectric semiconductor layer after the growth substrate is removed and before the photoelectric semiconductor layer is patterned.

7. The picking-up and placement process for electronic devices according to claim 1 , wherein the electric-programmable magnetic module comprises a plurality of electromagnetic coils and each of the electromagnetic coils is respectively controlled.

8. The picking-up and placement process for electronic devices according to claim 7 , wherein the electromagnetic coils of the electric-programmable magnetic module are arranged corresponding to parts of the electronic devices on the first substrate.

9. The picking-up and placement process for electronic devices according to claim 1 , wherein the electric-programmable magnetic module comprises:

a micro electro mechanical system (MEMS) chip comprising a plurality of electromagnetic coils, each of the electromagnetic coils being individually controlled; and

a bonding equipment, wherein the MEMS chip is assembled with and carried by the bonding equipment.

10. The picking-up and placement process for electronic devices according to claim 9 , wherein the electromagnetic coils of the MEMS chip are arranged corresponding to parts of the electronic devices on the first substrate.

11. The picking-up and placement process for electronic devices according to claim 1 , further comprising:

performing an in-situ testing for the electronic devices during the electronic devices picked-up by the electric-programmable magnetic module are bonded with the second substrate.

12. The picking-up and placement process for electronic devices according to claim 11 , further comprising:

when at least one failed electronic device is inspected by the in-situ testing, de-bonding the at least one failed electronic device from the second substrate and recording a position information of the failed electronic device; and

picking-up and bonding at least one of the remaining electronic devices from the first substrate to the second substrate by the electric-programmable magnetic module according the position information.

13. The picking-up and placement process for electronic devices according to claim 1 , further comprising:

performing a testing for the electronic devices after the electronic devices picked-up by the electric-programmable magnetic module are bonded with the second substrate.

14. The picking-up and placement process for electronic devices according to claim 13 , further comprising:

when at least one failed electronic device is inspected by the testing, de-bonding the at least one failed electronic device from the second substrate and recording a position information of the failed electronic device; and

picking-up and bonding at least one of the remaining electronic devices from the first substrate to the second substrate by the electric-programmable magnetic module according the position information.

15. A picking-up and placement process for electronic devices, comprising:

(a) providing a first substrate having a plurality of electronic devices formed thereon, the electronic devices being arranged in an array, and each of the electronic devices comprising a magnetic portion;

(b) selectively picking-up parts of the electronic devices from the first substrate via a magnetic force generated from an electric-programmable magnetic module; and

(c) bonding the parts of the electronic devices picked-up by the electric-programmable magnetic module with a second substrate,

wherein a method for fabricating the first substrate having the electronic devices thereon comprises:

forming a photoelectric semiconductor layer on a growth substrate;

forming a plurality of electrodes on the photoelectric semiconductor layer;

bonding the photoelectric semiconductor layer with the first substrate through an adhesive, wherein the adhesive adheres with the electrodes and the photoelectric semiconductor layer and is between the photoelectric semiconductor layer and the first substrate;

removing the growth substrate from the photoelectric semiconductor layer;

patterning the photoelectric semiconductor layer and the adhesive to form the electronic devices and a plurality of adhesive patterns disposed under the electronic devices;

forming a supporting layer on the first substrate, wherein the supporting layer is between and connects the electronic devices, and each of the adhesion patterns is exposed by the supporting layer; and

removing the adhesion patterns to form a gap between each of the electronic devices and the first substrate.

16. The picking-up and placement process for electronic devices according to claim 15 , further comprising:

repeating step (a) through step (c) at least one time to bond the electronic devices formed on different first substrates with the second substrate.

17. The picking-up and placement process for electronic devices according to claim 16 , wherein the electronic devices formed on different first substrates emit different colored lights.

18. The picking-up and placement process for electronic devices according to claim 15 , further comprising:

thinning the photoelectric semiconductor layer after the growth substrate is removed and before the photoelectric semiconductor layer is patterned.

19. The picking-up and placement process for electronic devices according to claim 15 , wherein the electric-programmable magnetic module comprises a plurality of electromagnetic coils and each of the electromagnetic coils is respectively controlled.

20. The picking-up and placement process for electronic devices according to claim 19 , wherein the electromagnetic coils of the electric-programmable magnetic module are arranged corresponding to parts of the electronic devices on the first substrate.

21. The picking-up and placement process for electronic devices according to claim 15 , wherein the electric-programmable magnetic module comprises:

a micro electro mechanical system (MEMS) chip comprising a plurality of electromagnetic coils, each of the electromagnetic coils being individually controlled; and

a bonding equipment, wherein the MEMS chip is assembled with and carried by the bonding equipment.

22. The picking-up and placement process for electronic devices according to claim 21 , wherein the electromagnetic coils of the MEMS chip are arranged corresponding to parts of the electronic devices on the first substrate.

23. The picking-up and placement process for electronic devices according to claim 15 , further comprising:

performing an in-situ testing for the electronic devices during the electronic devices picked-up by the electric-programmable magnetic module are bonded with the second substrate.

24. The picking-up and placement process for electronic devices according to claim 23 , further comprising:

when at least one failed electronic device is inspected by the in-situ testing, de-bonding the at least one failed electronic device from the second substrate and recording a position information of the failed electronic device; and

picking-up and bonding at least one of the remaining electronic devices from the first substrate to the second substrate by the electric-programmable magnetic module according e position information.

25. The picking-up and placement process for electronic devices according to claim 15 , further comprising:

performing a testing for the electronic devices after the electronic devices picked-up by the electric-programmable magnetic module are bonded with the second substrate.

26. The picking-up and placement process for electronic devices according to claim 25 , further comprising:

when at least one failed electronic device is inspected by the testing, de-bonding the at least one failed electronic device from the second substrate and recording a position information of the failed electronic device; and

picking-up and bonding at least one of the remaining electronic devices from the first substrate to the second substrate by the electric-programmable magnetic module according the position information.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 5, 2016
From: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
To: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE; PLAYNITRIDE INC.
Reel/Frame 038462/0923 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 9, 2015
From: WU, MING-HSIEN; FANG, YEN-HSIANG; CHAO, CHIA-HSIN
To: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Reel/Frame 037243/0219 →
Priority Claims (2)
TW 103143505 A · Dec 12, 2014 · national
TW 104121139 A · Jun 30, 2015 · national
Continuity (2)
Provisional Application 62085657 · Dec 1, 2014
Related Publication 20160172253A1 · Jun 16, 2016