Enhanced Surface Plasmon Resonance method
The disclosure relates to processing SPR signals, in particular signals obtained by illuminating a conductive surface with light at two wavelengths. Processing SPR signals can involve processing a first and second signal indicative of an intensity of light, received from a conductive layer at which SPR has occurred, as a function of angle of incidence, reflection or diffraction at the layer. The first and second signals each have two dips corresponding to a respective wavelength of the light at a respective angle at which surface plasmon resonance occurs for the respective wavelength and a peak between the two dips. The processing includes deriving a first and second value of a quantity indicative of signal magnitudes in the region of the peak. The first and second values can be compared to detect a change in refractive index at the layer after the first signal and before the second signal was captured.
1. A system for detecting a change in refractive index, the system comprising:
a light source arrangement for simultaneously illuminating a conductive layer with light at two wavelengths;
a detector arrangement for measuring an intensity of light returned from the conductive surface at angles lying between an angle at which a first intensity minimum due to Surface Plasmon Resonance at one of the wavelengths occurs and an angle at which a second intensity minimum due to Surface Plasmon Resonance at the other one of the wavelengths occurs; and
a processor for detecting a change in the refractive index at the conductive layer by detecting a change in the measured intensity, wherein the processor is arranged to implement a method comprising:
processing a first signal indicative of an intensity of light, received from the conductive layer at which SPR has occurred, as a function of angle of incidence, reflection or diffraction at the layer, the first signal having two dips corresponding to a respective wavelength of the light at a respective angle at which surface plasmon resonance occurs for the respective wavelength and a peak between the two dips, wherein the processing includes deriving a first value of a quantity indicative of signal magnitude in the region of the peak;
processing a second signal indicative of an intensity of light, received from the conductive layer at which SPR has occurred, as a function of angle of incidence, reflection or diffraction at the layer, the second signal having two dips corresponding to a respective wavelength of the light at a respective angle at which surface plasmon resonance occurs for the respective wavelength and a peak between the two dips, wherein the processing includes deriving a second value of a quantity indicative of signal magnitude in the region of the peak; and
comparing the first and second values to detect a change in refractive index at the conductive layer after the first signal and before the second signal was captured.
2. The system of claim 1 , wherein the light source arrangement comprises two laser diodes, means for combining light emitted from the two laser diodes and means for tuning the wavelength emitted by each laser diode.
3. A system as claimed in claim 2 , wherein the means for tuning comprise a cooling or heating element disposed between the laser diodes or next to one of the laser diodes.
4. The system of claim 1 , the processor being arranged to quantify a concentration of target molecules in a sample applied to the conductive surface based on change in the measured intensity.